Atomic Force Microscopes

Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM) for imaging the surface of a range of materials from metals to semiconductors to biological tissue, in some cases, to the atomic level. These instruments can also be used to characterize surface topography, surface chemistry and the nanomechanical properties of surfaces.

Below is a list of partners we work with in this field:

Nanosurf

Showing all 12 results


  • The DriveAFM, Nanosurf‘s new flagship instrument, utilizes the latest technology to deliver stable, high-end performance. It was designed to fulfill the needs of top notch research, today and in the future.

    • CleanDrive: stable excitation in air and liquid
    • Ultra low noise: below 15 fm/√Hz
    • Direct drive: high-resolution imaging and large scan area
    • Fully motorized system: full control via software

     

  • The DriveAFM, Nanosurf‘s new flagship instrument, utilizes the latest technology to deliver stable, high-end performance. It was designed to fulfill the needs of top notch research, today and in the future.

    • CleanDrive: stable excitation in air and liquid
    • Ultra low noise: below 15 fm/√Hz
    • Direct drive: high-resolution imaging and large scan area
    • Fully motorized system: full control via software

     

  • The most flexible and versatile atomic force microscope for materials research

    • Modular concept to exactly match your needs
    • Compatible with inverted microscopes
    • Flat and linear scanning thanks to flexure-based scanner technology
    • True flexibility with exchangeable cantilever holders for specialized tasks
    • Scanning capabilities in liquid and advanced measurement modes
    • Suitable for any sample size

     

    • Compact and robust atomic force microscope for stand alone and large stage operation
    • Easy and quick cantilever exchange and alignment reduces downtime
    • Automated batch measurements and scripting interface for system integration

     

  • The tip-scanning AFM for heavy and large samples up to 300 mm

    • Standard AFM system
    •  300 mm x 300 mm sample stage
    •  Ideal for samples up to 45 kg

     

    • Mounts on virtually every upright optical microscope or 3D optical profilometer
    • Integrated motor for automated cantilever approach and engage
    • Standard and extended AFM modes available through a modular controller

     

    • Compact and robust atomic force microscope for stand alone and large stage operation
    • Easy and quick cantilever exchange and alignment reduces downtime
    • Automated batch measurements and scripting interface for system integration

     

  • All-in-one atomic force microscope for small samples and nanoeducation

    • A robust and high-quality AFM product
    • No setup needed: just plug in and go!
    • Check out the NaioAFM video tutorials
    • Options and accessories available
    • Very competitive pricing: ask for a quote now!

     

    • Atomic resolution in minutes
    • Extremely simple handling and reliable operation
    • Controller and scan head integrated into a single device: just connect USB and power
    • Starting at less than $10,000 USD

     

  • Market leading experience in FluidFM for AFM

    • Highly accurate pressure, force, and position control with optical sample access
    • Different FluidFM® probes: hollow cantilevers designed for specific applications
    • Pioneering research within reach

     

  • The best solution for automated force mapping

    • Straightforward experimental workflow: only a few steps from sample mounting to results
    • One-click cantilever calibration: automatic cantilever deflection sensitivity and spring constant (Sader method) measurement
    • Real-time data analysis: Young’s modulus, adhesion, and indentation are calculated and displayed during the measurement
    • Facilitates measurements on demanding samples: experimental workflow repositions the sample for every measurement area

     

  • AFM systems fully tailored to your specifications

    • Meeting to understan your requirements
    • Nansosurf outlines solution
    • joint discussion of solution,
    • adaptation solution concept
    • order based on concept

     


Showing all 12 results