Extend the resolution of your upright microscope or 3D profilometer
The Nanosurf LensAFM is an atomic force microscope that can be used as a normal objective lens on almost any optical microscope or profilometer. It greatly extends the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well.
Your easy entry into the world of atoms
he first scanning tunneling microscope (STM) was developed in 1981 by Binnig and Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making atoms directly visible to a small group of specialists. In 1997, Nanosurf went one step further and brought atoms to the classroom!
Today, well over a thousand Nanosurf STMs play a crucial role in nanotechnology education around the globe:
The NaioSTM is the successor to the well-known Easyscan 2 STM and brings together scan head and controller in a single instrument for even greater ease of installation, usability, and transportability. The whole setup is very resistant to vibrations and can be used to achieve atomic resolution on HOPG in standard classroom situations.