905-890-0555

NaniteAFM — The leading mountable AFM

  • Compact and robust atomic force microscope for stand alone and large stage operation
  • Easy and quick cantilever exchange and alignment reduces downtime
  • Automated batch measurements and scripting interface for system integration

 

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Description

 

Flex-ANA — AFM for force mapping

Compact and mountable atomic force microscope for large-sample measurements

The unparalleled small footprint of the NaniteAFM scan head makes it the ideal atomic force microscope for integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures. Simple handling and a multitude of integration possibilities bring your product analyses to a whole new level. Check coatings for intended structures or irregularities alike, measure surface roughness of treated or untreated materials, or use additional AFM measurement modes to detect features not visible in topography alone. Its ease of use and reproducibility make the NaniteAFM the perfect quality control tool for precision engineering, production process optimization, or semiconductor fabrication

— just to name a few.

Contact Spectra Research

Address

3585 Laird Rd., Unit 15 & 16,
L5L 5Z8 Mississauga
Ontario
Canada

Phone :  905-890-0555

Toll Free : 1-866-753-4433
Fax :  905-890-1959

About Spectra Research

Spectra Research Corporation (SRC) offers a range of innovative high-quality scientific products and laboratory services to industrial and scientific markets throughout Canada.

Established in 1993, SRC is a subsidiary of Allan Crawford Associates (ACA), one of Canada’s largest distributors of electronic components, test equipment and integrated networking solutions.

Spectra Research Location

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