Spectroscopy

Showing 17–24 of 24 results


    • Compact and robust atomic force microscope for stand alone and large stage operation
    • Easy and quick cantilever exchange and alignment reduces downtime
    • Automated batch measurements and scripting interface for system integration

     

  • All-in-one atomic force microscope for small samples and nanoeducation

    • A robust and high-quality AFM product
    • No setup needed: just plug in and go!
    • Check out the NaioAFM video tutorials
    • Options and accessories available
    • Very competitive pricing: ask for a quote now!

     

    • Atomic resolution in minutes
    • Extremely simple handling and reliable operation
    • Controller and scan head integrated into a single device: just connect USB and power
    • Starting at less than $10,000 USD

     

  • Market leading experience in FluidFM for AFM

    • Highly accurate pressure, force, and position control with optical sample access
    • Different FluidFM® probes: hollow cantilevers designed for specific applications
    • Pioneering research within reach

     

  • The best solution for automated force mapping

    • Straightforward experimental workflow: only a few steps from sample mounting to results
    • One-click cantilever calibration: automatic cantilever deflection sensitivity and spring constant (Sader method) measurement
    • Real-time data analysis: Young’s modulus, adhesion, and indentation are calculated and displayed during the measurement
    • Facilitates measurements on demanding samples: experimental workflow repositions the sample for every measurement area

     

  • AFM systems fully tailored to your specifications

    • Meeting to understan your requirements
    • Nansosurf outlines solution
    • joint discussion of solution,
    • adaptation solution concept
    • order based on concept

     

    • Cylindrical mirror analyzer (CMA)
    • Coaxial 25 kV field emission electron gun
    • Scintillation secondary electron detector
    • High energy resolution module
    • 5 axis automated sample stage
    • 5 kV floating column Ar+ ion gun
    • SmartSoft-Auger instrument control software
    • MultiPak data reduction software
    • Acoustic Enclosure
    • Ion pumped main chamber

     

    • TRIFT mass analyzer
    • 30 kV LMIG with Bi, Au, or Ga emitter
    • Dual beam charge neutralization
    • 5 axis sample stage
    • In-situ optical viewing
    • Secondary electron detector
    • WinCadence instrument control and data reduction software package
    • Analysis chamber with four primary ion gun ports
    • 350 l/s turbo molecular pump
    • Integrated bakeout facilities
    • MS/MS ready spectromoter

     


Showing 17–24 of 24 results