Webinar Announcement: Recent Developments and Applications of Lab-based HAXPES Using the PHI Quantes Scanning XPS Microprobe

Lab-based HAXPES


Presented by Ben Schmidt, Ph.D., Senior Staff Scientist

July 14, 2022 at 10:00 a.m. CST

In this webinar, Ben will discuss recent developments on the PHI Quantes Scanning XPS/HAXPES Microprobe instrument, which utilizes both Al Ka (1486.6 eV) and Cr Ka (5414.8 eV) X-ray sources for XPS and HAXPES analysis, respectively. Significant advances have been made in developing sensitivity factors for quantitative HAXPES analysis, as well as software improvements for data collection and processing. Several application areas will be highlighted to show the advantage of the Cr X-ray source in analysis of battery materials, microelectronics, carbon-containing materials, and perovskites.

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