Spectra Research Corporation (SRC) is committed to bringing our clients the newest in technological innovation and providing the best service possible. We are thus excited to announce the release in Canada of the new Heidelberg MLA 100 Maskless Aligner – the next generation of direct writing.

Heidelberg, Germany-based Heidelberg Instruments has 30 years of experience developing and manufacturing complex laser-based maskless lithography systems. The new Heidelberg MLA 100 Maskless Aligner is top-of-the-line, offering all capabilities required for single-layer and multi-layer applications.

With easy operation, the MLA 100 Maskless Aligner features an intuitive user interface, a simple loading procedure, and advanced, reliable technology. Unlike other pattern generators on the market, the MLA100 has extreme exposure speed. In less than 10 minutes, an area 100×100 mm² with structures as small as 1 micron can be exposed. Alignment in multi-layer applications can also be achieved quickly as the product’s three integrated cameras with varying resolutions enable alignment to be obtained within 2 minutes.

MLA 100 Maskless Aligner Features

• Substrates up to 9”x 9”
• Alignment accuracy down to 1 µm
• Exposure area of 150×150 mm²
• Alignment accuracy of 500nm
• Backside alignment
• Non-contact exposure

Serving customers worldwide, Heidelberg strives to reduce the cost of product ownership and supports customers to maximize uptime.

For more information:
Paul Greenwood
President – Spectra Research Corporation
5805 Kennedy Road, Mississauga, ON L4Z 2G3

Tel: 905-502-2012 | Fax: 905-890-1959 | Toll Free Fax: 888-890-1959
Email: paulg@aca.ca | website: www.spectraresearch.com

Oxford Instruments Asylum Research Presents the Webinar “How to Choose the Right Probe for Your Atomic Force Microscopy Experiments”

Target audience: All AFM users

Keywords: Atomic Force Microscopy (AFM), Scanning Probe Microscopy (SPM), probes, cantilever

August 24, 2016 (Santa Barbara, CA) Successful atomic force microscopy (AFM) imaging starts with choosing the right probe for your sample and scan mode. It’s one of the most important considerations when doing an experiment. Asylum Research’s webinar “How to Choose the Right Probe for Your AFM Experiments” aims to make all AFM users experts at probe selection. The webinar will be presented September 8, 2016, 8:00am PDT, by Asylum Research Applications Scientist, Dr. Ted Limpoco. Registration is at www.oxford-instruments.com/ProbeWebinar.

“Choosing the right probe from hundreds available, even for an experienced user, can be a daunting task,” said Dr. Limpoco. “At Asylum, we scan an incredible number of different samples under various conditions and modes daily, so we have a deep understanding of what works and what doesn’t. This is an excellent opportunity to share our knowledge and experience with the entire AFM community.”

Topics discussed in the webinar include:
• AFM probe fundamentals and calibration
• Probe selection for imaging in air and liquid
• Probe selection for specific scan modes (e.g. MFM, high resolution imaging, nanomechanics)
• Specialized probes
• Real-world image examples

About Oxford Instruments Asylum Research

Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research, and biophysics.

In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical and electromechanical characterization.

Recent advances have made these measurements far simpler and more automated for increased consistency and productivity. Its Cypher™ and MFP-3D™ AFM product lines span a wide range of performance and budgets. Asylum Research also offers its exclusive SurfRider™ AFM probes among a comprehensive selection of AFM probes, accessories, and consumables. Sales, applications and service offices are located in the United States, Germany, United Kingdom, Japan, France, India, China and Taiwan, with distributor offices in other global regions.

About Oxford Instruments plc

Oxford Instruments designs, supplies and supports high-technology tools and systems with a focus on research and industrial applications. Innovation has been the driving force behind Oxford Instruments’ growth and success for over 50 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.

The first technology business to be spun out from Oxford University, Oxford Instruments objective is to be the leading provider of new generation tools and systems for the research and industrial sectors with a focus on nanotechnology. Its key market sectors include nano-fabrication and nano-materials. The company’s strategy is to expand the business into the life sciences arena, where nanotechnology and biotechnology intersect.

This involves the combination of core technologies in areas such as low temperature, high magnetic field and ultra high vacuum environments; Nuclear Magnetic Resonance; x-ray, electron, laser and optical based metrology; atomic force microscopy; optical imaging; advanced growth, deposition and etching.

Oxford Instruments aims to pursue responsible development and deeper understanding of our world through science and technology. Its products, expertise, and ideas address global issues such as energy, environment, security and health.

For further information please Contact Us

Oxford Instruments Asylum Research in Conjunction with Materials Today Presents the Webinar: “More Than Just Roughness: AFM Techniques for Thin Film Analysis”

Focus: Webinar announcement

Target audience: Thin film researchers and scientists

Keywords: Atomic Force Microscopy (AFM), Scanning Probe Microscopy (SPM), Thin Films

Brief Overview: Oxford Instruments Asylum Research in conjunction with Materials Today presents the webinar: “More Than Just Roughness: AFM Techniques for Thin Film Analysis” on June 1, 2016 at 11:00am EDT. This informative webinar is ideal for scientists in both academia and industry who are interested in learning about the latest AFM techniques for thin film characterization. Distinguished presenters are Dr. Donna Hurley, founder of Lark Scientific and former NIST project leader, and Dr. Kumar Virwani, Staff Member at IBM Research, Almaden, CA.

“AFM has been used extensively for imaging and analysis at the nanoscale and has played an integral part in advancing thin films and coatings research,” said Jason Li, Applications Manager, Asylum Research. “What is so exciting are the numerous measurements beyond basic 3D topography and roughness that are available today, such as quantitative modes for measuring nanoelectrical properties and nanomechanical properties (storage modulus and loss tangent). With state-of-the art instrumentation such as the Asylum Research Cypher AFM, high resolution and fast scanning make it easy to capture dynamic processes for a wide range of materials. This insightful webinar is an excellent resource for scientists in both academia and industry who want to learn more about the latest AFM techniques for thin film characterization.”

Registration for the webinar can be found at: http://www.materialstoday.com/characterization/webinars/afm-techniques-for-thin-film-analysis/

Should you have any questions or need any additional information, please contact Nushaw Ghofranian, Marketing Coordinator, Asylum Research, an Oxford Instruments company, 805-696-6466, nushaw.ghofranian@oxinst.com, www.oxford-instruments.com/AFM

 ThinFilmsWebinar-final

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Evaluate the influence of surface roughness on wettability Recorded webinar Many surface modification and coating technologies that are used for optimizing wetting and adhesion properties influence both surface chemistry and roughness. Understanding the mechanisms that impact wetting by separating these two factors can be a useful tool in product development processes and in quality control. Watch this recorded webinar to learn more about the method. Speaker: Principal Application Specialist Matthew Dixon Watch webinar

Complex Fluid-Fluid Interfaces: Dynamics, Rheology, and Microstructure Recorded webinar Complex fluid-fluid interfaces arise whenever constituents (molecular and colloidal) residing within bulk phases become adsorbed and, in many cases, strongly interact. When this occurs, the mechanical response of a fluid interface can become highly nonlinear and time-dependent. This webinar introduces the thermodynamics, microstructure, and mechanical response of such interfaces. It begins with a discussion of the phase behavior of these systems and develops the basic equations and analysis of capillarity. This is followed by a description of interfacial viscoelasticity in both shear and dilatational modes of deformation. Invited Speaker: Professor Gerald G Fuller, Stanford University Watch webinar

Complex fluid/fluid systems can be characterized with interfacial rheology

Complex fluid/fluid systems, such as emulsions, gels and various surfactant solutions, are the basis of most of our everyday consumer products from detergents to healthcare, but also found in biology and industrial processes such as in enhanced oil recovery and mineral processing.

Read more

Evaluate the influence of surface roughness on wettability

While contact angle (CA) goniometry involving placing a drop of liquid on a surface and measuring the resulting angle has been around for many years, we have only recently developed a system to account for the underlying surface’s micro-scale roughness.

Read more

Wettability analysis for inkjet printing

Surface tension of inkjet inks and the wettability of the printing substrate are important factors influencing the final printing quality and process reliability. Surface tension and interfacial interactions can be explored with various technologies.

Read more

Click here to register 

AFM-IR spectra (left) and morphology (right) of a polymer blend across a rubber/nylon interface, demonstrating the high chemical spatial resolution of AFM-IR.

For more information on the nanoIR2, click here.

VISCO ❄ HOLIDAY

As a sign of customer appreciation and for the end of 2015, RheoSense presents a viscometer give-away and other prizes for all those completing our end-of-year survey. The following prizes will be awarded:

One Grand Prize: A microVISC viscometer* + 50$ Amazon Gift Card

• Five Second Prizes: 50$ Amazon Gift Cards
• All participants providing a referral to a friend or college will receive a 10% discount* in all RheoSense products and services?

Automated High Throughput Viscosity Measurements 

m-VROC™ Viscometer

The ideal viscometer for demanding R&D applications, m-VROC™ provides flexibility — measuring a wide dynamic range of shear rates with samples as small as 20 microliters. It is the leading viscometer in protein viscosity measurements and many other applications.

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hts-VROC™ Viscometer

The most advanced viscometer for the development of lubricating oils, hts-VROC™ measures oil viscosity from 4 ºC to 125 ºC at shear rates ranging from 100 to 1,000,000 1/s. By providing a complete viscosity curve, it allows you to fully assess your lubricant’s quality.

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microVISC- m™ Viscometer

microVISC-m™ viscometer quickly checks the health of your oil. It measures oil viscosity at room temperature and extrapolates estimates of kinematic and dynamic viscosities at 40, 50, and 100 ºC. The device requires a simple one-step operation. Using disposable pipettes, it does not need to be cleaned between tests.