Product Announcement – Heidelberg Instruments’ MLA 100 Maskless Aligner

Spectra Research Corporation (SRC) is committed to bringing our clients the newest in technological innovation and providing the best service possible. We are thus excited to announce the release in Canada of the new Heidelberg MLA 100 Maskless Aligner – the next generation of direct writing.

Heidelberg, Germany-based Heidelberg Instruments has 30 years of experience developing and manufacturing complex laser-based maskless lithography systems. The new Heidelberg MLA 100 Maskless Aligner is top-of-the-line, offering all capabilities required for single-layer and multi-layer applications.

With easy operation, the MLA 100 Maskless Aligner features an intuitive user interface, a simple loading procedure, and advanced, reliable technology. Unlike other pattern generators on the market, the MLA100 has extreme exposure speed. In less than 10 minutes, an area 100×100 mm² with structures as small as 1 micron can be exposed. Alignment in multi-layer applications can also be achieved quickly as the product’s three integrated cameras with varying resolutions enable alignment to be obtained within 2 minutes.

MLA 100 Maskless Aligner Features

  • Substrates up to 9”x 9”
  • Alignment accuracy down to 1 µm
  • Exposure area of 150×150 mm²
  • Alignment accuracy of 500nm
  • Backside alignment
  • Non-contact exposure

Serving customers worldwide, Heidelberg strives to reduce the cost of product ownership and supports customers to maximize uptime.

 

For more information:
Paul Greenwood
President – Spectra Research Corporation
5805 Kennedy Road, Mississauga, ON L4Z 2G3

Tel: 905-502-2012 | Fax: 905-890-1959 | Toll Free Fax: 888-890-1959
Email: paulg@aca.ca | website: www.spectraresearch.com

Asylum Research Presents AFM Probe Webinar

Oxford Instruments Asylum Research Presents the Webinar “How to Choose the Right Probe for Your Atomic Force Microscopy Experiments”

Target audience: All AFM users

Keywords: Atomic Force Microscopy (AFM), Scanning Probe Microscopy (SPM), probes, cantilever

August 24, 2016 (Santa Barbara, CA) Successful atomic force microscopy (AFM) imaging starts with choosing the right probe for your sample and scan mode. It’s one of the most important considerations when doing an experiment. Asylum Research’s webinar “How to Choose the Right Probe for Your AFM Experiments” aims to make all AFM users experts at probe selection. The webinar will be presented September 8, 2016, 8:00am PDT, by Asylum Research Applications Scientist, Dr. Ted Limpoco. Registration is at www.oxford-instruments.com/ProbeWebinar.

“Choosing the right probe from hundreds available, even for an experienced user, can be a daunting task,” said Dr. Limpoco. “At Asylum, we scan an incredible number of different samples under various conditions and modes daily, so we have a deep understanding of what works and what doesn’t. This is an excellent opportunity to share our knowledge and experience with the entire AFM community.”

Topics discussed in the webinar include:
• AFM probe fundamentals and calibration
• Probe selection for imaging in air and liquid
• Probe selection for specific scan modes (e.g. MFM, high resolution imaging, nanomechanics)
• Specialized probes
• Real-world image examples

About Oxford Instruments Asylum Research

Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research, and biophysics.

In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical and electromechanical characterization.

Recent advances have made these measurements far simpler and more automated for increased consistency and productivity. Its Cypher™ and MFP-3D™ AFM product lines span a wide range of performance and budgets. Asylum Research also offers its exclusive SurfRider™ AFM probes among a comprehensive selection of AFM probes, accessories, and consumables. Sales, applications and service offices are located in the United States, Germany, United Kingdom, Japan, France, India, China and Taiwan, with distributor offices in other global regions.

About Oxford Instruments plc

Oxford Instruments designs, supplies and supports high-technology tools and systems with a focus on research and industrial applications. Innovation has been the driving force behind Oxford Instruments’ growth and success for over 50 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.

The first technology business to be spun out from Oxford University, Oxford Instruments objective is to be the leading provider of new generation tools and systems for the research and industrial sectors with a focus on nanotechnology. Its key market sectors include nano-fabrication and nano-materials. The company’s strategy is to expand the business into the life sciences arena, where nanotechnology and biotechnology intersect.

This involves the combination of core technologies in areas such as low temperature, high magnetic field and ultra high vacuum environments; Nuclear Magnetic Resonance; x-ray, electron, laser and optical based metrology; atomic force microscopy; optical imaging; advanced growth, deposition and etching.

Oxford Instruments aims to pursue responsible development and deeper understanding of our world through science and technology. Its products, expertise, and ideas address global issues such as energy, environment, security and health.

For further information please Contact Us

New Application Note Describes Atomic Force Microscopy Tools for Nanoscale Electrical Characterization

Oxford Instruments Asylum Research announces its new application note describing atomic force microscopy (AFM) tools for nanoelectrical characterization. The application note discusses the most recent nanoelectrical characterization techniques, as well as the benefits and exclusive modes that the Asylum Research Cypher™ and MFP-3D™ AFMs offer. Researchers will learn more about evaluating local electrical properties, including current, surface charge and potential, dielectric breakdown, conductivity, and permittivity.

The application note can be downloaded at www.oxford-instruments.com/electrical-characterization.

Not only do the dimensions of silicon-based devices keep shrinking to a few nanometers, but also next- generation processes with nanoscale components like nanotubes, graphene, and molecular building blocks are emerging. Understanding physical processes that control electrical behavior increasingly

requires AFM measurements on smaller length scales,” said Keith Jones, Asylum Research Applications Scientist, specializing in electrical characterization. “This application note is a great reference for scientists new to AFM as well as those currently working in the field.”

Asylum Research AFMs are being used by leading researchers around the globe for characterizing nanoelectrical properties. A variety of their publications can be found at: www.oxford-instruments.com/nanoelectrical-afm.

Figure caption: Kelvin Probe Force Microscopy surface potential overlaid on topography for flakes of boron nitride (small triangles) and graphene (large irregular features) grown on a copper foil substrate.

About Oxford Instruments Asylum Research

Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research, and biophysics. In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical and electromechanical characterization. Recent advances have made these measurements far simpler and more automated for increased consistency and productivity.  Its Cypher™ and MFP-3D™ AFM product lines span a wide range of performance and budgets.  Asylum Research also offers its exclusive SurfRider™ AFM probes among a comprehensive selection of AFM probes, accessories, and consumables. Sales, applications and service offices are located in the United States, Germany, United Kingdom, Japan, France, India, China and Taiwan, with distributor offices in other global regions.

About Oxford Instruments plc

Oxford Instruments designs, supplies and supports high-technology tools and systems with a focus on research and industrial applications. Innovation has been the driving force behind Oxford Instruments’ growth and success for over 50 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.

The first technology business to be spun out from Oxford University, Oxford Instruments objective is to be the leading provider of new generation tools and systems for the research and industrial sectors with a focus on nanotechnology. Its key market sectors include nano-fabrication and nano-materials. The company’s strategy is to expand the business into the life sciences arena, where nanotechnology and biotechnology intersect.

This involves the combination of core technologies in areas such as low temperature, high magnetic field and ultra high vacuum environments; Nuclear Magnetic Resonance; x-ray, electron, laser and optical based metrology; atomic force microscopy; optical imaging; advanced growth, deposition and etching.

Oxford Instruments aims to pursue responsible development and deeper understanding of our world through science and technology. Its products, expertise, and ideas address global issues such as energy, environment, security and health.

Asylum Research Presents an AFM Webinar on Thin Films

Oxford Instruments Asylum Research in Conjunction with Materials Today Presents the Webinar: “More Than Just Roughness: AFM Techniques for Thin Film Analysis”

Focus: Webinar announcement

Target audience: Thin film researchers and scientists

Keywords: Atomic Force Microscopy (AFM), Scanning Probe Microscopy (SPM), Thin Films

Brief Overview: Oxford Instruments Asylum Research in conjunction with Materials Today presents the webinar: “More Than Just Roughness: AFM Techniques for Thin Film Analysis” on June 1, 2016 at 11:00am EDT. This informative webinar is ideal for scientists in both academia and industry who are interested in learning about the latest AFM techniques for thin film characterization. Distinguished presenters are Dr. Donna Hurley, founder of Lark Scientific and former NIST project leader, and Dr. Kumar Virwani, Staff Member at IBM Research, Almaden, CA.

“AFM has been used extensively for imaging and analysis at the nanoscale and has played an integral part in advancing thin films and coatings research,” said Jason Li, Applications Manager, Asylum Research. “What is so exciting are the numerous measurements beyond basic 3D topography and roughness that are available today, such as quantitative modes for measuring nanoelectrical properties and nanomechanical properties (storage modulus and loss tangent). With state-of-the art instrumentation such as the Asylum Research Cypher AFM, high resolution and fast scanning make it easy to capture dynamic processes for a wide range of materials. This insightful webinar is an excellent resource for scientists in both academia and industry who want to learn more about the latest AFM techniques for thin film characterization.”

Registration for the webinar can be found at: http://www.materialstoday.com/characterization/webinars/afm-techniques-for-thin-film-analysis/

Should you have any questions or need any additional information, please contact Nushaw Ghofranian, Marketing Coordinator, Asylum Research, an Oxford Instruments company, 805-696-6466, nushaw.ghofranian@oxinst.com, www.oxford-instruments.com/AFM

Asylum Research Presents an AFM Webinar on Thin Films ThinFilmsWebinar-final

Biolin Scientific Newsletter

Dear Reader,

May is a busy time of the year. This newsletter is full of new interesting stuff to dig into. We have some recorded webinars, blog posts and not less than 7 conferences that we are attending. Check out the events section to see when you can meet up with us! Biolin Scientific Newsletter

All the best,
Anna Oom, Editor

biolin-scientific-newsletter

                                                                                                                   [Newsletter sign up]

biolin-scientific-newsletter


Evaluate the influence of surface roughness on wettability

Recorded webinar

Many surface modification and coating technologies that are used for optimizing wetting and adhesion properties influence both surface chemistry and roughness. Understanding the mechanisms that impact wetting by separating these two factors can be a useful tool in product development processes and in quality control. Watch this recorded webinar to learn more about the method.

Speaker: Principal Application Specialist Matthew Dixon

Watch webinar

biolin-scientific-newsletter
Complex Fluid-Fluid Interfaces: Dynamics, Rheology, and Microstructure

Recorded webinar

Complex fluid-fluid interfaces arise whenever constituents (molecular and colloidal) residing within bulk phases become adsorbed and, in many cases, strongly interact. When this occurs, the mechanical response of a fluid interface can become highly nonlinear and time-dependent. This webinar introduces the thermodynamics, microstructure, and mechanical response of such interfaces. It begins with a discussion of the phase behavior of these systems and develops the basic equations and analysis of capillarity. This is followed by a description of interfacial viscoelasticity in both shear and dilatational modes of deformation.

Invited Speaker: Professor Gerald G Fuller, Stanford University

Watch webinar

 biolin-scientific-newsletter

 

Recent Blog Posts

biolin-scientific-newsletterComplex fluid/fluid systems can be characterized with interfacial rheology

Complex fluid/fluid systems, such as emulsions, gels and various surfactant solutions, are the basis of most of our everyday consumer products from detergents to healthcare, but also found in biology and industrial processes such as in enhanced oil recovery and mineral processing.

Read more

 

biolin-scientific-newsletter
Evaluate the influence of surface roughness on wettability

While contact angle (CA) goniometry involving placing a drop of liquid on a surface and measuring the resulting angle has been around for many years, we have only recently developed a system to account for the underlying surface’s micro-scale roughness.

Read more

 

biolin-scientific-newsletterWettability analysis for inkjet printing

Surface tension of inkjet inks and the wettability of the printing substrate are important factors influencing the final printing quality and process reliability. Surface tension and interfacial interactions can be explored with various technologies.

Read more

 

 

Events

Here are the opportunities to meet with us during May!

May 10-11: Analytica, Munich, Germany – See the new Q-Sense Initiator or get a demo of Attension Theta Topography.

May 17-22: World Biomaterial Congress, Montreal, Canada – Learn more about our instruments for characterization of biomaterial surfaces and interactions.

May 22-24: CISILE, Beijing, China – See our equipment at the China International scientific instrument exhibition.

May 24-25: Surfex, Birmingham, UK – See the Attension tensiometers and learn more about the concepts of wettability and adhesion.

May 25-27: Biosensors, Gothenburg, Sweden – Listen to our seminar about biosensor research with QCM-D and see a live demo of the Q-Sense Pro.

May 25-27: Pulp and Paper, Stockholm, Sweden – Into wettability of paper and board or inkjet printing? See the Attension product line of tensiometers.

May 30-June 1: Nordic Rheology Conference, Helsinki, Finland – Learn about our solutions for interfacial rheology; the Attension Theta with PD200 and KSV NIMA ISR.

To see where we are going after May, check out Events on our website.

 

 

Share with colleagues and friends:     

 

 

 

Nanoscale IR Spectroscopy (AFM-IR) – Achieving Molecular Understanding of Polymer Systems – Webinar

Nanoscale IR Spectroscopy


Click here to register 


Webinar overview

Our guest speaker, Greg Meyers of Dow Chemical Company, will discuss Dow’s research in polymer systems using AFM-IR. Dow is using AFM-IR to provide a deeper understanding at the molecular level of polymer systems to observe chemical contrasts in polymeric materials. The ability to obtain IR spectra at high spatial resolutions has allowed them to observe for the first time the subtle and sharp changes in polymeric films, blends, and membranes.

Topics include:

Introduction to AFM-IR technology & recent AFM-IR innovations

Special focus on AFM-IR application in polymer systems

Hybrid multi-layer polymer films

Review of AFM-IR spatial resolution

Chemical characterization of a polymer blend


AFM-IR spectra (left) and morphology (right) of a polymer blend across a rubber/nylon interface, demonstrating the high chemical spatial resolution of AFM-IR.


For more information on the nanoIR2, click here.

Nanoscale IR Spectroscopy

Evaluate the influence of surface roughness on wettability [Webinar]

Not rendering correctly? View this email as a web page here.

 

biolin_together_294x87

 

[Webinar]

Evaluate the influence of surface roughness on wettability

Speaker Matthew Dixon, PhD, Principal Application Scientist at Biolin Scientific 

topo_3d.png

While contact angle goniometry has been around for many years, we have recently developed a way to account for the underlying surface’s micro-scale roughness. This approach allows us to report the true Young’s Contact Angle (CA) by measuring and subtracting out the roughness contribution. 

In this webinar you will learn more about:

  • How water sessile drop CAs were acquired at the exact same location that fringe projection phase-shifting was used to analyze the surface roughness on a wide variety of different samples.
  • How we characterized optics with anti-reflective coatings, clay tiles with gloss or matte finishes, wood polymer composite materials used for outdoor decking, and titanium materials used for biomedical implants with varying degrees of roughness.

Date and Time
Wednesday April 27th 2016

Los Angeles: 10 am
New York: 1 pm
Helsinki: 8 pm
London: 6 pm

If you miss the webinar, don’t worry! We will email you a link to the recording.


Register for Webinar: Evaluate the influence of surface roughness on wettability

Abstract

While contact angle (CA) goniometry involving placing a drop of liquid on a surface and measuring the resulting angle has been around for many years, we have only recently developed a way to account for the underlying surface’s micro-scale roughness.  This approach allows us to report the true Young’s CA by measuring and subtracting out the roughness contribution.  In this paper we demonstrate how water sessile drop CAs were acquired at the exact same location that fringe projection phase-shifting was used to analyze the surface roughness on a wide variety of different samples.  We characterized optics with anti-reflective coatings, clay tiles with gloss or matte finishes, wood polymer composite materials used for outdoor decking, and titanium materials used for biomedical implants with varying degrees of roughness.  The results show roughness corrected CAs greater than 90 o give lower Young’s CAs and corrected CAs less than 90 o show larger Young’s CAs.

Share with colleagues and friends:

Webinar: Methods of Viscosity Measurements

 Visco❄holiday: Viscometer GiftRh

► Webinar: Methods of Viscosity Measurements 

 

VISCO❄HOLIDAY

As a sign of customer appreciation and for the end of 2015, RheoSense presents a viscometer give-away and other prizes for all those completing our end-of-year survey. The following prizes will be awarded:

  • One Grand Prize: A microVISC viscometer* + 50$ Amazon Gift Card
  • Five Second Prizes: 50$ Amazon Gift Cards
  • All participants providing a referral to a friend or college will receive a 10% discount* in all RheoSense products and services

View Ink Application Notes

click

Webinar: Methods of Viscosity Measurements

December 16, 2015 | 11:00 am PST

‘How to measure viscosity?’
In this webinar, we examine how great engineering minds have tackled this question over the years.

We trace the historical development of viscosity and viscometers; starting with the fundamental principles established by Sir Isaac Newton and leading up to modern-day viscometry methods.

Sign up to attend the webinar and get an extra drawing for our promotion! Interested in learning more? Click the button below!

Attend

*Please note, all webinar sign ups will be given an extra entry on our Holiday Viscometer Giveaway!

download

wine vis

Upcoming Conference

Booth

Enter to win ! VISCO HOLIDAY

VISCO ❄ HOLIDAY

visco

As a sign of customer appreciation and for the end of 2015, RheoSense presents a viscometer give-away and other prizes for all those completing our end-of-year survey. The following prizes will be awarded:

One Grand Prize: A microVISC viscometer* + 50$ Amazon Gift Card

  • Five Second Prizes: 50$ Amazon Gift Cards
  • All participants providing a referral to a friend or college will receive a 10% discount* in all RheoSense products and services?

http://www.rheosense.com/events/viscoholiday2015?utm_content=9c21546c5eee2cf80932f71a48fc2f10&utm_campaign=Visco%E2%9D%84Holiday%202015&utm_source=Robly.com&utm_medium=email

New automatic viscometer

Stop_Watch

Automated High Throughput Viscosity Measurements 

High Throughput Automatic Viscometer initium Specifications

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Please check out a product preview video here!

Viscometers

We have developed the most advanced viscometers on the market to meet increasing demands for more-accurate, faster, and easier-to use small sample viscometers.

Small-sample viscometer, m-VROC

m-VROC™ Viscometer

The ideal viscometer for demanding R&D applications, m-VROC™ provides flexibility — measuring a wide dynamic range of shear rates with samples as small as 20 microliters. It is the leading viscometer in protein viscosity measurements and many other applications.


High-temperature Viscometer, hts-VROC


hts
-VROC™ Viscometer

The most advanced viscometer for the development of lubricating oils, hts-VROC™ measures oil viscosity from 4 ºC to 125 ºC at shear rates ranging from 100 to 1,000,000 1/s. By providing a complete viscosity curve, it allows you to fully assess your lubricant’s quality.


Portable, small-sample viscometer, microVISCmicroVISC™ Viscometer

A portable, small footprint viscometer that performs rapid, routine viscosity measurements. microVISC™ is the fastest and easiest-to use viscometer for most applications, and is idea for quality control and small-scale R&D.


Portable, small-sample viscometer, microVISC-m

microVISC- m™ Viscometer


microVISC-m™ viscometer quickly checks the health of your oil. It measures oil viscosity at room temperature and extrapolates estimates of kinematic and dynamic viscosities at 40, 50, and 100 ºC. The device requires a simple one-step operation. Using disposable pipettes, it does not need to be cleaned between tests.

Technology—Viscometer/Rheometer-on-a-Chip

Viscometer-Rheometer-on-a-Chip (VROC®) combines microfluidic and MEMS (Micro-Electro-Mechanical Systems) technologies.

The Superior Viscometer

Compared to conventional viscometers and rheometers, microfluidic devices offer several advantages. They:

  • Require small sample volumes of liquid
  • Impose high shear rates without encountering flow stability
  • Maintain complete enclosure of fluid to prevent evaporation
  • Can be used as simple flow-through device

More Accurate Viscosity Measurements

Products built on our technology platform completely characterize flow, helping you achieve cost-effective flow and material characterization. Complete viscosity characterization is essential in the production of complex liquids with non-Newtonian viscosity characteristics.

Our technology quantifies true flow properties, whereas many existing products only qualitatively approximate apparent properties.

Why MEMS and Microfluidics for Viscosity?

Microfluidics deals with the behavior, precise control, and manipulation of small (microliter and nanoliter) volumes of liquids. Microfluidics enables high throughput analysis.

MEMS chips integrate mechanical elements, sensors, actuators, and electronics on a common silicon substrate, using microfabrication technology.

Through its hybrid microfluidics/MEMS technology, RheoSense has developed smaller, smarter, and faster micro-scale-sample viscometers, which can measure fluids’ viscosity in all types of environments.

Principle of RheoSense Viscometers

VROC® sensors read viscosity by measuring the pressure drop as a test liquid flows through its flow channel. This is a well-known application of rheometry principles (K. Walters, Rheometry, Chapman and Hall, London, 1975) and also listed in US Pharmacopeia.

Slit Viscometer/Rheometer

As the test liquid is forced to flow through the sensor’s flow channel, the rheometer measures pressure at positions increasingly far from the inlet.

In this resulting (example) plot of measured pressure versus sensor position, the slope of the straight line is proportional to the viscosity.

Slope of pressure/position graph indicates viscosity

Our Viscometer Implementation

To create a dynamic micro-sample viscometer, RheoSense took this principle and added microfludics, while reducing the device’s size. Our resulting VROC® technology offers capabilities well beyond the limits of conventional viscometers.
quote-symbol-lt-tp

VROC® is capable of making measurements not possible with other instruments…the ability of the RheoSense viscometer to measure very small sample quantities is also useful. We have found the instrument to be accurate and reliable
quote-symbol-tt-btm

— A corporate R&D Customer