Oxford Instruments Asylum Research in Conjunction with Materials Today Presents the Webinar: “More Than Just Roughness: AFM Techniques for Thin Film Analysis”
Focus: Webinar announcement
Target audience: Thin film researchers and scientists
Keywords: Atomic Force Microscopy (AFM), Scanning Probe Microscopy (SPM), Thin Films
Brief Overview: Oxford Instruments Asylum Research in conjunction with Materials Today presents the webinar: “More Than Just Roughness: AFM Techniques for Thin Film Analysis” on June 1, 2016 at 11:00am EDT. This informative webinar is ideal for scientists in both academia and industry who are interested in learning about the latest AFM techniques for thin film characterization. Distinguished presenters are Dr. Donna Hurley, founder of Lark Scientific and former NIST project leader, and Dr. Kumar Virwani, Staff Member at IBM Research, Almaden, CA.
“AFM has been used extensively for imaging and analysis at the nanoscale and has played an integral part in advancing thin films and coatings research,” said Jason Li, Applications Manager, Asylum Research. “What is so exciting are the numerous measurements beyond basic 3D topography and roughness that are available today, such as quantitative modes for measuring nanoelectrical properties and nanomechanical properties (storage modulus and loss tangent). With state-of-the art instrumentation such as the Asylum Research Cypher AFM, high resolution and fast scanning make it easy to capture dynamic processes for a wide range of materials. This insightful webinar is an excellent resource for scientists in both academia and industry who want to learn more about the latest AFM techniques for thin film characterization.”
Registration for the webinar can be found at: http://www.materialstoday.com/characterization/webinars/afm-techniques-for-thin-film-analysis/
Should you have any questions or need any additional information, please contact Nushaw Ghofranian, Marketing Coordinator, Asylum Research, an Oxford Instruments company, 805-696-6466, firstname.lastname@example.org, www.oxford-instruments.com/AFM