This exclusive quarterly newsletter highlights the latest product announcements, application specific solutions, and news about the company. Take a look inside the latest developments at Herzan and see if these new developments can complement your research!
AVS 65 Lunch n Learn Complementary XPS TOF-SIMS
Physical Electronics User Reception
AVS 65 – Long Beach, CA
For the characterization of polymers and organic-coated surfaces, the combination of two surface sensitive techniques – X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) can be extremely powerful. XPS provides quantitative analysis and short-range bonding chemistry from elements on the outermost surface while TOF-SIMS can provide the molecular information needed to positively identify organic species and the spatial resolution needed to show their lateral distributions on the sample surface. This presentation will discuss the complementary attributes of XPS and TOF-SIMS and demonstrate how combining the two is essential to more fully understand organic surfaces.
We look forward to seeing you there!
Learn How Video-rate AFM can image surfactant micelle dynamics
Opens new research possibilities into surfactant behavior at solid-liquid interfaces
(Free download, compliments of Asylum Research, the Technology Leader in Atomic Force Microscopy)
Download the application note to learn:
Watch the Full Movies From the Application Note
|Figure 2: Video captured at 5.8 fps (173 ms per frame), showing clearly the rows of CTAB hemimicelles on the HOPG surface and the orientation of the domain boundaries. Tapping mode phase data is shown here for optimum contrast. The video plays back at 23.2 fps (i.e. 4× the acquisition rate).
|Figure 3: Video captured at 0.48 fps (250 Hz line rate) showing two CTAB grains of opposite row orientation (upper-left and lower-right) bounded on the left and right by two grains with parallel orientation. Over time, the two grains narrow at their boundary, eventually separating and drifting apart while the adjacent grains on the left and right merge together. Note the three different row orientations, corresponding to the three directions perpendicular to the HOPG symmetry axes. Video is shown at a playback speed of 1.92 frames per second (i.e. 4× the acquisition rate).|
|Figure 4: Video captured at 0.95 fps (250 Hz line rate) showing the spontaneous formation of a narrow CTAB grain along the boundary of two orientation domains (upper left). The grain continues to grow for about 20 s until a broader grain in the same orientation begins to emerge behind it. This new grain continues to grow and push the smaller grain out of the field of view. The video plays back at 3.8 fps (i.e. 4× the acquisition rate).||Figure 5: The video here was acquired at 0.95 fps (250 Hz line rate). Images in the application note highlight two examples, both of which show small features that seem to absorb into surrounding grains. The process appears analogous to Ostwald ripening, except in this two-dimensional system instead of a bulk dispersion. In both cases, the feature appears with higher phase contrast and appears less structured than the surrounding hemimicelles. The video plays back at 3.8 frames per second (i.e. 4× the acquisition rate).|
The movies about were taken using the Cypher VRS Video-Rate AFM
The Cypher VRS AFM is the first and only full-featured video-rate AFM. Finally, researchers can measure nanoscale dynamic processes at video-rate speeds with all of the resolution, versatility, and ease of use that are the hallmarks of an Asylum Research Cypher AFM.
Herzan is excited to announce it’s Summer Savings Program! This program allows researchers to save big on Herzan’s most popular products (up to 30%), including the TS Series active vibration isolation tables, WaveCatcher site survey tools, and AEK-2002 acoustic enclosures.
Don’t delay, start saving for your research today!
These promotions are available for a limited time: 9/30/2018. Click the links below to check out these exclusive offers!
July 24, 2018 (Santa Barbara, CA) Understanding and characterizing magnetic properties at the nanoscale is one of the key challenges in developing next-generation data storage and logic elements. The new Variable Field Module (VFM4) accessory for Asylum Research MFP-3D Atomic Force Microscopes (AFMs) enables measurements under applied in-plane and out-of-plane magnetic fields in order to better understand their effects on nanoscale magnetic domain structure. The VFM4 is capable of applying either an adjustable in-plane (±8000 G ) or out-of-plane (±1200 G) magnetic field to a sample and offers ~1 G field resolution. Researchers can learn more about the VFM4 and see recent results at http://afm.oxinst.com/VFM4.
“This new combination of capabilities has allowed one customer at a national synchrotron facility to use AFM for research that was previously only possible with very costly and time-consuming scanning x-ray transmission microscopy (SXTM),” said Dr. Maarten Rutgers, Director of New Product Introduction. “No other AFM commercial solution offers the same capabilities, versatility, and ease of use for magnetics research. While the VFM has traditionally been used for magnetic force microscopy experiments, it can also be used with techniques like conductive AFM (CAFM) and on a wide range of diverse samples including piezoelectric and ferroelectric materials.”
The VFM4 easily attaches to most Asylum Research MFP-3D AFMs and includes replaceable pole tips to quickly adapt between in-plane and out-of-plane configurations. It maintains a steady magnetic field with rare-earth magnets that produce no heat, thermal drift, or mechanical vibration. For experiments where both an applied magnetic field and a high tip-sample voltage bias are required, there is an optional high-voltage kit to adapt the VFM4 for safe application of voltages up to ±220 Volts.
Image caption: Magnetic skyrmions in Co-based thin film pads imaged with MFM under out-of-plane magnetic fields. Image courtesy of K. Bouzehouane, Unité Mixte de Physique CNRS, Thales, Univ. Paris-Sud, Université Paris-Saclay France.
About Oxford Instruments Asylum Research
Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research, and biophysics. In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical and electromechanical characterization. Recent advances have made these measurements far simpler and more automated for increased consistency and productivity. Its Cypher™ and MFP-3D™ AFM product lines span a wide range of performance and budgets. Asylum Research also offers its exclusive SurfRider™ AFM probes among a comprehensive selection of AFM probes, accessories, and consumables. Sales, applications and service offices are located in the United States, Germany, United Kingdom, Japan, France, India, China and Taiwan, with distributor offices in other global regions.
About Oxford Instruments plc
Oxford Instruments designs, supplies and supports high-technology tools and systems with a focus on research and industrial applications. Innovation has been the driving force behind Oxford Instruments’ growth and success for over 50 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.
The first technology business to be spun out from Oxford University, Oxford Instruments objective is to be the leading provider of new generation tools and systems for the research and industrial sectors with a focus on nanotechnology. Its key market sectors include nano-fabrication and nano-materials. The company’s strategy is to expand the business into the life sciences arena, where nanotechnology and biotechnology intersect.
This involves the combination of core technologies in areas such as low temperature, high magnetic field and ultra high vacuum environments; Nuclear Magnetic Resonance; x-ray, electron, laser and optical based metrology; atomic force microscopy; optical imaging; advanced growth, deposition and etching.
Oxford Instruments aims to pursue responsible development and deeper understanding of our world through science and technology. Its products, expertise, and ideas address global issues such as energy, environment, security and health.
For further information please Contact Us
September 13, 2018
Dr. Rajiv Giridharagopal, Ginger Lab, University of Washington–Seattle
Rajiv Giridharagopal has been a Senior Research Scientist in Prof. David Ginger’s laboratory at the University of Washington–Seattle since 2015, with a research focus on SPM development for photovoltaic, bioelectronic, and related materials. He previously worked at the Intel Corporation in optical microscopy development. He earned a Ph.D. in Electrical Engineering from Rice University and holds two patents.
Dr. F. Ted Limpoco, Oxford Instruments Asylum Research
Ted Limpoco is an Applications Scientist at Oxford Instruments. He has over 10 years of AFM experience in nanoelectrical, nanomechanical, and nanotribology techniques. He was previously a postdoctoral fellow at the University of Illinois at Urbana-Champaign and has a Ph.D. in chemistry from the University of Florida.
- Cypher VRS Video-Rate AFM
- Graphene and 2D Materials
- Choosing the Best AFM Probe
- Analysis of Thin Films
- Characterization of Polymers
- Advanced PFM
- Introduction to PFM
- Cypher AFM
- blueDrive Photothermal Excitation
- Nanomechanical Mapping with Contact Resonance
- Getting Started with AFM and Biology
- Nanomechanical Mapping with AM-FM Mode
- Ultra-High Resolution Imaging wih Cypher AFMs
Who Should Attend
Encouraging more widespread adoption of solar cells as a renewable and sustainable energy resource hinges upon reducing costs and increasing conversion efficiency. To achieve these goals, photovoltaic (PV) materials such as hybrid organic-inorganic perovskites and organic semiconductors hold promise for next-generation devices. Understanding the nanoscale properties of these emerging materials is critical in optimizing their performance. The atomic force microscope (AFM) is superbly suited for this purpose, measuring nanoscale structure and electrical behavior to gain deeper insight into relations between structure, properties, processing, and performance. The new application note “AFM Characterization of Emerging Photovoltaics” from Oxford Instruments Asylum Research discusses how AFMs are being used to image nanoscale electrical and functional response and map morphology in perovskites and organic materials. It also highlights the exclusive features, benefits, and operating modes of Asylum Research AFMs that enable successful materials characterization. The application note can be downloaded here.
“This application note is a must-read if you’re a scientist using AFM for photovoltaic applications or if you plan to integrate AFM into your research,” said Jason Li, Applications Manager, Asylum Research. “Exciting new results examples are presented from the world’s leading researchers who are at the forefront of developing next-generation solar-cell materials and devices with Asylum Research AFMs.” .
Asylum Research Cypher and MFP-3D AFMs offer high resolution, easy operation, and a wide variety of functional imaging modes. Specifically designed or this application, the Photovoltaics Option for the MFP-3D Infinity AFM offers a flexible, turnkey platform featuring a customizable, bottom-side sample illumination. Asylum AFMs are easily configured for use in a glovebox and have a wide variety of accessories for remarkable environmental control for oxygen-and water-sensitive PV materials.
Figure caption: Nanoscale photoresponse image showing short-circuit current ISC overlaid on topography for a methylammonium lead triiodide (CH3NH3PbI3 or MAPbI3) film under ~0.07 W/cm2 illumination. Adapted from Y. Kutes, Y. Zhou, J. L. Bosse, J. Steffes, N. P. Padture, and B. D. Huey, Nano Lett. 16, 3434 (2016).
We at Herzan are excited to meet with researchers at the Microscopy & Microanalysis Meeting in the Baltimore Convention Center in Baltimore, Maryland.
We will be sharing our latest innovations in the field of environmental control, designed specifically to address needs within the microscopy community.
Stop by Booth 1206 to learn more about the unprecedented vibration isolation performance of the AVI Series and discover how you can save money and time installing an instrument by utilizing the WaveCatcher site survey tool.
Also, there will be some free giveaways at the booth to bring home to family and friends and share with colleagues in the lab!
WHAT: Discover Herzan’s Innovations for Environmental Control
Herzan’s environmental solutions support a wide range of research applications relevant to M&M attendees, including:
Double the benefits – a modern rheometer and 20% savings!
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20% Savings: Trade-in your old rheometer and take advantage of up-front savings to get a new HAAKE Viscotester iQ system into your lab. Eligible trade-in rheometers include the Thermo Scientific™ Viscotester™ 550 or an equivalent rheometer from any manufacturer. The 20% savings offer is valid for purchases before December 31, 2018, and it extends to a temperature control module and standard measuring geometries purchased along with the rheometer.