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Herzan Happenings – Fall 2018 Edition

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This exclusive quarterly newsletter highlights the latest product announcements, application specific solutions, and news about the company. Take a look inside the latest developments at Herzan and see if these new developments can complement your research!

IN THIS ISSUE

Stop By Booth 809 at the MRS Fall Meeting in Boston, MA

Save Big On Herzan’s Most Popular Products During Fall Savings Program

Featured Case Study: SEM Improves Stability Using Herzan’s AVI Platform

Herzan Happenings - Fall 2018 Edition

Herzan Happenings – Fall 2018 Edition

B&W Tek November Newsletter

Advances in Raman throughout the Pharmaceutical Manufacturing Process 

The importance of quality control in continuous manufacturing has lead to a rapid increase in the use of Raman spectroscopy. In our latest webinar we explore how Raman spectroscopy is paving the way for innovation in advanced manufacturing techniques, with a presentation by Dr. Douglas Hausner of Associate Director of Rutgers University’s  Engineering Research Center for Structured Organic Particulate Systems (C-SOPS).

New E-Book on the Tools, Techniques and Applications of Raman Spectroscopy

Portable and handheld Raman systems are gradually replacing slow and destructive techniques that have been widely used throughout the pharmaceutical industry. This month, B&W Tek partnered with American Pharmaceutical Review to release a new E-Book highlighting these recent developments in the industry. The E-book features various tools, techniques and applications that use Raman Spectroscopy to perform tasks such as at-line content uniformity, counterfeit detection and raw material identification.

Meet the Team!

Meet Kevin Wu: a seasoned foodie, full time cat dad and the new inside sales administrator at B&W Tek! Kevin is a Delaware native who graduated from Drexel University with a degree in criminal justice. He now uses his 7 years of experience in aviation quality control to give clerical assistance to our account managers and handle logistics for our sales team. It would be an understatement to say that we are excited to have Kevin join the B&W Tek family!

View our upcoming events!

California Narcotics Officers Assocation Training Expo
Booth 212
San Diego, California

November 16-20, 2018

MRS Fall 
Booth 611
Boston, Massachusetts
November 25-30, 2018

USBTA Technology Training Expo
Technology Training Lane
Orlando, Florida

December 2-4, 2018

 

AVS 65 Lunch n Learn – Complementary XPS & TOF-SIMS

AVS 65 Lunch n Learn Complementary XPS TOF-SIMS

Physical Electronics User Reception

AVS 65 – Long Beach, CA

Physical Electronics would like to cordially invite you to join us on
Monday, October 22, 2018 from 8:30-10:30pm at the Hyatt Regency Long Beach in the Beacon Ballroom (Sec. A) for appetizers and drinks
for our annual PHI User Reception. 

WHEN: Monday, October 22, 2018, 8:30-10:30pm(Immediately following Welcome Mixer)
WHERE: Hyatt Regency Long Beach – Beacon Ballroom (Sec. A)
Drinks and Appetizers will be provided.

Please RSVP for the reception by emailing Ben Ellefson 
at  Bellefson@phi.com  by October 19 if you’ll be able to attend. 

For the characterization of polymers and organic-coated surfaces, the combination of two surface sensitive techniques – X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) can be extremely powerful.  XPS provides quantitative analysis and short-range bonding chemistry from elements on the outermost surface while TOF-SIMS can provide the molecular information needed to positively identify organic species and the spatial resolution needed to show their lateral distributions on the sample surface.  This presentation will discuss the complementary attributes of XPS and TOF-SIMS and demonstrate how combining the two is essential to more fully understand organic surfaces.

We look forward to seeing you there!

Oxford Instruments New Application Note: Video-Rate AFM Opens New Research Possibilities into Surfactant Behavior at Solid-Liquid Interfaces

Learn How Video-rate AFM can image surfactant micelle dynamics

Opens new research possibilities into surfactant behavior at solid-liquid interfaces

application note about using atomic force microscopy to study surfactant dynamics at solid-liquid interfaces

(Free download, compliments of Asylum Research, the Technology Leader in Atomic Force Microscopy)

Download the application note to learn:

  • Introduction to the self-assembly of surfactant micelles at solid-liquid interfaces
  • Challenges associated with characterizing the dynamic behavior of these systems
  • New capability provided by video-rate AFM to visualize these dynamics
  • Several example datasets and links to the full movies (see below)

 

 

Watch the Full Movies From the Application Note

Figure 2: Video captured at 5.8 fps (173 ms per frame), showing clearly the rows of CTAB hemimicelles on the HOPG surface and the orientation of the domain boundaries. Tapping mode phase data is shown here for optimum contrast. The video plays back at 23.2 fps (i.e. 4× the acquisition rate). 

 

Figure 3: Video captured at 0.48 fps (250 Hz line rate) showing two CTAB grains of opposite row orientation (upper-left and lower-right) bounded on the left and right by two grains with parallel orientation. Over time, the two grains narrow at their boundary, eventually separating and drifting apart while the adjacent grains on the left and right merge together. Note the three different row orientations, corresponding to the three directions perpendicular to the HOPG symmetry axes. Video is shown at a playback speed of 1.92 frames per second (i.e. 4× the acquisition rate).
Figure 4: Video captured at 0.95 fps (250 Hz line rate) showing the spontaneous formation of a narrow CTAB grain along the boundary of two orientation domains (upper left). The grain continues to grow for about 20 s until a broader grain in the same orientation begins to emerge behind it. This new grain continues to grow and push the smaller grain out of the field of view. The video plays back at 3.8 fps (i.e. 4× the acquisition rate). Figure 5: The video here was acquired at 0.95 fps (250 Hz line rate). Images in the application note highlight two examples, both of which show small features that seem to absorb into surrounding grains. The process appears analogous to Ostwald ripening, except in this two-dimensional system instead of a bulk dispersion. In both cases, the feature appears with higher phase contrast and appears less structured than the surrounding hemimicelles. The video plays back at 3.8 frames per second (i.e. 4× the acquisition rate).

The movies about were taken using the Cypher VRS Video-Rate AFM

The Cypher VRS AFM is the first and only full-featured video-rate AFM. Finally, researchers can measure nanoscale dynamic processes at video-rate speeds with all of the resolution, versatility, and ease of use that are the hallmarks of an Asylum Research Cypher AFM.

  • High resolution video-rate imaging at up to 625 lines per second
  • Exceptional ease of use—even at 10 frames per second
  • Full range of modes and accessories—all the capabilities of Cypher ES at normal scan speeds
Cypher VRS, the first and only full-feature video-rate atomic force microscope

Save Big During Herzan’s – Summer Savings Program

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Herzan is excited to announce it’s Summer Savings Program! This program allows researchers to save big on Herzan’s most popular products (up to 30%), including the TS Series active vibration isolation tables, WaveCatcher site survey tools, and AEK-2002 acoustic enclosures.

Don’t delay, start saving for your research today!

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These promotions are available for a limited time: 9/30/2018. Click the links below to check out these exclusive offers!

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New Asylum Research AFM Accessory Enables Advanced Magnetics Research Under Both In-Plane and Out-of-Plane Applied Magnetic Fields

July 24, 2018 (Santa Barbara, CA) Understanding and characterizing magnetic properties at the nanoscale is one of the key challenges in developing next-generation data storage and logic elements.  The new Variable Field Module (VFM4) accessory for Asylum Research MFP-3D Atomic Force Microscopes (AFMs) enables measurements under applied in-plane and out-of-plane magnetic fields in order to better understand their effects on nanoscale magnetic domain structure. The VFM4 is capable of applying either an adjustable in-plane (±8000 G ) or out-of-plane (±1200 G) magnetic field to a sample and offers ~1 G field resolution. Researchers can learn more about the VFM4 and see recent results at http://afm.oxinst.com/VFM4.

“This new combination of capabilities has allowed one customer at a national synchrotron facility to use AFM for research that was previously only possible with very costly and time-consuming scanning x-ray transmission microscopy (SXTM),” said Dr. Maarten Rutgers, Director of New Product Introduction. “No other AFM commercial solution offers the same capabilities, versatility, and ease of use for magnetics research. While the VFM has traditionally been used for magnetic force microscopy experiments, it can also be used with techniques like conductive AFM (CAFM) and on a wide range of diverse samples including piezoelectric and ferroelectric materials.”

The VFM4 easily attaches to most Asylum Research MFP-3D AFMs and includes replaceable pole tips to quickly adapt between in-plane and out-of-plane configurations. It maintains a steady magnetic field with rare-earth magnets that produce no heat, thermal drift, or mechanical vibration. For experiments where both an applied magnetic field and a high tip-sample voltage bias are required, there is an optional high-voltage kit to adapt the VFM4 for safe application of voltages up to ±220 Volts.

Image caption:  Magnetic skyrmions in Co-based thin film pads imaged with MFM under out-of-plane magnetic fields. Image courtesy of K. Bouzehouane, Unité Mixte de Physique CNRS, Thales, Univ. Paris-Sud, Université Paris-Saclay France.

 

Applied Magnetic Fields

        Download PDF

About Oxford Instruments Asylum Research

Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research, and biophysics. In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical and electromechanical characterization. Recent advances have made these measurements far simpler and more automated for increased consistency and productivity.  Its Cypher™ and MFP-3D™ AFM product lines span a wide range of performance and budgets.  Asylum Research also offers its exclusive SurfRider™ AFM probes among a comprehensive selection of AFM probes, accessories, and consumables. Sales, applications and service offices are located in the United States, Germany, United Kingdom, Japan, France, India, China and Taiwan, with distributor offices in other global regions.

About Oxford Instruments plc 

Oxford Instruments designs, supplies and supports high-technology tools and systems with a focus on research and industrial applications. Innovation has been the driving force behind Oxford Instruments’ growth and success for over 50 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.

The first technology business to be spun out from Oxford University, Oxford Instruments objective is to be the leading provider of new generation tools and systems for the research and industrial sectors with a focus on nanotechnology. Its key market sectors include nano-fabrication and nano-materials. The company’s strategy is to expand the business into the life sciences arena, where nanotechnology and biotechnology intersect.

This involves the combination of core technologies in areas such as low temperature, high magnetic field and ultra high vacuum environments; Nuclear Magnetic Resonance; x-ray, electron, laser and optical based metrology; atomic force microscopy; optical imaging; advanced growth, deposition and etching.

Oxford Instruments aims to pursue responsible development and deeper understanding of our world through science and technology. Its products, expertise, and ideas address global issues such as energy, environment, security and health.

For further information please Contact Us

AFM Characterization of Emerging Photovoltaics Webinar September 13, 2018 at 11:30am EDT

September 13, 2018
11:30am-12:30pm EDT 
(3:30-4:30pm UTC)

This free webinar, held in conjunction with the Materials Research Society (MRS), provides an overview of AFM applications for emerging photovoltaics including hybrid organic-inorganic perovskites and organic semiconductors.

• Discover the latest AFM techniques to accurately map local photocurrent, work function, and other electrical response in photoactive materials and charge transport layers

• See real-world results from leading researchers in the field on a variety of photovoltaic systems using standard and advanced AFM techniques

• Learn how AFM has become simpler with turnkey instrumentation for better AFM optical experim

Presenters

Dr. Rajiv Giridharagopal, Ginger Lab, University of Washington–Seattle

Rajiv Giridharagopal has been a Senior Research Scientist in Prof. David Ginger’s laboratory at the University of Washington–Seattle since 2015, with a research focus on SPM development for photovoltaic, bioelectronic, and related materials. He previously worked at the Intel Corporation in optical microscopy development. He earned a Ph.D. in Electrical Engineering from Rice University and holds two patents.

Dr. F. Ted Limpoco, Oxford Instruments Asylum Research

Ted Limpoco is an Applications Scientist at Oxford Instruments. He has over 10 years of AFM experience in nanoelectrical, nanomechanical, and nanotribology techniques. He was previously a postdoctoral fellow at the University of Illinois at Urbana-Champaign and has a Ph.D. in chemistry from the University of Florida.

 

Webinar Archives

  • Cypher VRS Video-Rate AFM
  • Graphene and 2D Materials
  • Choosing the Best AFM Probe
  • Analysis of Thin Films
  • Characterization of Polymers
  • Advanced PFM
  • Introduction to PFM
  • Cypher AFM
  • blueDrive Photothermal Excitation
  • Nanomechanical Mapping with Contact Resonance
  • Getting Started with AFM and Biology
  • Nanomechanical Mapping with AM-FM Mode
  • Ultra-High Resolution Imaging wih Cypher AFMs

Who Should Attend

 

 

New Application Note Details CharacterizingEmerging Photovoltaic Materials with Atomic Force Microscopy

Encouraging more widespread adoption of solar cells as a renewable and sustainable energy resource hinges upon reducing costs and increasing conversion efficiency. To achieve these goals, photovoltaic (PV) materials such as hybrid organic-inorganic perovskites and organic semiconductors hold promise for next-generation devices. Understanding the nanoscale properties of these emerging materials is critical in optimizing their performance. The atomic force microscope (AFM) is superbly suited for this purpose, measuring nanoscale structure and electrical behavior to gain deeper insight into relations between structure, properties, processing, and performance. The new application note “AFM Characterization of Emerging Photovoltaics” from Oxford Instruments Asylum Research discusses how AFMs are being used to image nanoscale electrical and functional response and map morphology in perovskites and organic materials. It also highlights the exclusive features, benefits, and operating modes of Asylum Research AFMs that enable successful materials characterization. The application note can be downloaded here.

“This application note is a must-read if you’re a scientist using AFM for photovoltaic applications or if you plan to integrate AFM into your research,” said Jason Li, Applications Manager, Asylum Research. “Exciting new results examples are presented from the world’s leading researchers who are at the forefront of developing next-generation solar-cell materials and devices with Asylum Research AFMs.” .

Asylum Research Cypher and MFP-3D AFMs offer high resolution, easy operation, and a wide variety of functional imaging modes. Specifically designed or this application, the Photovoltaics Option for the MFP-3D Infinity AFM offers a flexible, turnkey platform featuring a customizable, bottom-side sample illumination. Asylum AFMs are easily configured for use in a glovebox and have a wide variety of accessories for remarkable environmental control for oxygen-and water-sensitive PV materials.

 

Figure caption: Nanoscale photoresponse image showing short-circuit current ISC overlaid on topography for a methylammonium lead triiodide (CH3NH3PbI3 or MAPbI3) film under ~0.07 W/cm2 illumination. Adapted from Y. Kutes, Y. Zhou, J. L. Bosse, J. Steffes, N. P. Padture, and B. D. Huey, Nano Lett. 16, 3434 (2016).

Discover the latest innovations in environmental control at Herzan’s booth (Booth 1206) during the M&M Meeting 2018.

 

We at Herzan are excited to meet with researchers at the Microscopy & Microanalysis Meeting in the Baltimore Convention Center in Baltimore, Maryland.

We will be sharing our latest innovations in the field of environmental control, designed specifically to address needs within the microscopy community.

Stop by Booth 1206 to learn more about the unprecedented vibration isolation performance of the AVI Series and discover how you can save money and time installing an instrument by utilizing the WaveCatcher site survey tool.

Also, there will be some free giveaways at the booth to bring home to family and friends and share with colleagues in the lab! 

WHEN: Aug 5th – 9th, 2018
Exhibit Dates: Aug 6th – 9th, 2018

WHERE: Baltimore Convention Center, Baltimore, MD (Booth 1206)

WHAT: Discover Herzan’s Innovations for Environmental Control

Popular Applications

Herzan’s environmental solutions support a wide range of research applications relevant to M&M attendees, including:

Atomic Force Microscopy

Electron Microscopy

 Tribology

Interferometry

HAAKE Viscotester iQ Special Trade-In Offer Details

 

Double the benefits – a modern rheometer and 20% savings!

Modern Rheometer: Enhance workflow efficiency with the latest generation Thermo Scientific™ HAAKE™ Viscotester™ iQ rheometer, designed to meet daily requirements of QC labs. This reliable QC rheometer sets new standards in modularity, ease of use, increased efficiency and intelligent user guidance, from simple viscosity determinations to complex rheological investigations.

20% Savings: Trade-in your old rheometer and take advantage of up-front savings to get a new HAAKE Viscotester iQ system into your lab. Eligible trade-in rheometers include the Thermo Scientific™ Viscotester™ 550 or an equivalent rheometer from any manufacturer. The 20% savings offer is valid for purchases before December 31, 2018, and it extends to a temperature control module and standard measuring geometries purchased along with the rheometer.

Contact us today to learn whether this special trade-in offer is right for you.

Rheometer trade-in offer

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Contact Spectra Research

Address

3585 Laird Rd., Unit 15 & 16,
L5L 5Z8 Mississauga
Ontario
Canada

Phone :  905-890-0555

Toll Free : 1-866-753-4433
Fax :  905-890-1959

About Spectra Research

Spectra Research Corporation (SRC) offers a range of innovative high-quality scientific products and laboratory services to industrial and scientific markets throughout Canada.

Established in 1993, SRC is a subsidiary of Allan Crawford Associates (ACA), one of Canada’s largest distributors of electronic components, test equipment and integrated networking solutions.

Spectra Research Location

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