The Next Tool in Surface Metrology Introducing the S wide

SRC is pleased to introduce Sensofar Metrology’s new metrology tool for wide areas—the S wide. The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high-resolution measuring instrument. On top of that, with single button acquisition, it is extremely easy to use.

S wide

Large-area 3D optical system

 

The S wide is a large-area 3D optical system providing solutions in the following fields:

  • Advanced manufacturing
  • Archaeology and paleontology
  • Consumer electronics
  • Medical devices
  • Molding
  • Optics
  • Watches

S wide features

  • Sub-micron height repeatability over entire extended area
  • One shot height measurement up to 40 mm without Z scanning
  • Bi-telecentric lenses with very low field distortion providing accurate metrology
  • Form deviation from 3D CAD models, providing the geometric difference and tolerance measurement

 

S wide

ISO standards

Traceability

Every S wide is manufactured to deliver accurate and traceable measurements. Systems are calibrated using traceable standards according to ISO 25178 and VDI 2634-2. 

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About Sensofar Metrology

Sensofar Metrology is a member of the Sensofar Group, headquartered near Barcelona, a technology and innovation hub. Sensofar Metrology’s mission is to develop, manufacture and market high-end 3D surface metrology instruments. They also provide consultancy within the field of metrology, and pursue a philosophy of guaranteeing advanced techniques, high quality and customer service.