Discount Products: Look through products available for a 25% – 50% discount in 2020. The items provided on a first come, first serve basis. View Discounted Products
SRC is pleased to introduce Sensofar Metrology’s new metrology tool for wide areas—the S wide. The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high-resolution measuring instrument. On top of that, with single button acquisition, it is extremely easy to use.
Large-area 3D optical system
The S wide is a large-area 3D optical system providing solutions in the following fields:
Advanced manufacturing
Archaeology and paleontology
Consumer electronics
Medical devices
Molding
Optics
Watches
S wide features
Sub-micron height repeatability over entire extended area
One shot height measurement up to 40 mm without Z scanning
Bi-telecentric lenses with very low field distortion providing accurate metrology
Form deviation from 3D CAD models, providing the geometric difference and tolerance measurement
ISO standards
Traceability
Every S wide is manufactured to deliver accurate and traceable measurements. Systems are calibrated using traceable standards according to ISO 25178 and VDI 2634-2.
Sensofar Metrology is a member of the Sensofar Group, headquartered near Barcelona, a technology and innovation hub. Sensofar Metrology’s mission is to develop, manufacture and market high-end 3D surface metrology instruments. They also provide consultancy within the field of metrology, and pursue a philosophy of guaranteeing advanced techniques, high quality and customer service.
As we did during the month of April, we would like to share a virtual coffee with you again this coming June.
Join our Four4Free weekly webinars to hear best-in-class metrology tips from our most experienced experts. This month we are focusing on a more technical field to get the most out of optical profilers in different applications.
The live events will take place every Thursday in June, one full hour of exciting keynotes and will allow time for your questions too.
We want to bring our knowledge to meet your new ideas!
OUR FIRST APPOINTMENT Learn more about the unlimited world of surface metrology
Optical Metrology Masterclass II: Be an Expert on Thickness & Interferometry
A second chance to learn everything we know
Our most renowned expert, Dr. Roger Artigas CTO & President of Sensofar Metrology, will dive deep into the features that identify Thickness & Interferometry optical measurement technologies to solve any challenge or question you may have regarding the use of them.
Introduction, Ion Beams, MS/MS, and Materials Applications
FREE LIVE WEBINAR
Thursday, May 14, 2020 – 10:00am (Chicago)
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a powerful analytical technique that can provide elemental and molecular information with high sensitivity from the sample surface to tens of microns into the sample. Additionally, TOF-SIMS can produce chemical images with high spatial resolution (<70 nm). This is achieved by utilizing a variety of ion beams to either analyze (Binq+, Au nq+, C60q+, Ga+), sputter (O2+, Cs+, Ar+, large gas cluster Ar), or mill (Ga+ FIB) the sample. The most recent advancement in TOF-SIMS is the capability of MS/MS (i.e. tandem MS) which enables confident molecular identification. The flexibility of TOF-SIMS makes it a valuable tool to investigate a wide range of materials. This webinar will introduce the fundamentals of TOF-SIMS, discuss ion beams and MS/MS, and show materials applications.
WHEN
Thursday, May 14, 2020 – 10:00am (Chicago)
WHAT
TOF-SIMS 101: Introduction, Ion Beams, MS/MS, and Materials Applications
PRESENTER
Andrew Giordani – Physical Electronics Staff Scientist
PLEASE CLICK THE LINK BELOW TO REGISTER FOR THE EVENT!
Sensofar Metrology is one of two divisions of the Sensofar group, based in Barcelona, Spain, an innovation and technology hub. Sensofar Metrology is renowned for its:
High-end, non-contact, 3D surface profilers based on complementary confocal, interferometry, focus variation and spectroscopy reflectometer techniques;
Consultancy within the field of metrology;
Advanced R&D generating patented technologies contributing to hundreds of surface metrology applications worldwide.
Non-contact 3D surface metrology
3D surface metrology is the measurement and characterization of micro- and nano-scale features on natural or manufactured surfaces. This is done efficiently by capturing the 3D spatial coordinates of points on a surface using a non-destructive optical technique.
Surface topography at the nanometer level
Optical surface profilers have crucial advantages over tactile approaches:
Measurement is non-contact, so there’s no damage to the object being measured;
Optical techniques can measure through transparent media, are fast and flexible, and yield 3D (areal) results;
Measurement performance depends on wavelength and numerical aperture, eliminating limitations caused by the physical size of a stylus tip.
The most common optical techniques available are confocal, interferometry and focus variation, each of these has their own strengths and weaknesses.
Superior vertical resolution with confocal
Confocal: Confocal profilers measure the surface height of smooth to very rough surfaces, with spatial sampling as low as 0.10 μm—ideal for critical dimension measurements. High NA (0.95) and high magnification (150X) objectives are available to measure steep local slopes >70° on smooth surfaces with and up to 86° on rough surfaces. Sensofar’s proprietary confocal algorithms provide vertical repeatability on the nm scale.
Interferometry: White-light vertical scanning interferometers (VSI) measure the surface height of smooth to moderately rough surfaces, providing nm vertical resolution regardless of the NA. Sensofar’s new S neox optical 3D profiling microscope can use all available magnifications to profile shape features with no compromise in height resolution.
Focus variation: Focus variation has been developed for measuring the shape of large rough surfaces. Sensofar’s implementation of this approach has been specifically designed to complement confocal measurements at low magnification. Highlights of the technology include high slope surfaces (up to 86°), highest measurement speeds (mm/s) and large vertical range. This combination of features is largely suited to tooling applications.
Sensofar Metrology products
New S neox: The new S neox optical 3D profiling microscope outperforms all previous microscopes of its kind in terms of performance, functionality, efficiency and design. It combines all three of the above techniques: confocal (best for surfaces with high slopes), interferometry (highest vertical resolution) and focus variation (measures shape in seconds). The S neox does all this in the same sensor head without any moving parts. The S neox delivers three-in-one technologies for class-leading areal measurement.
S neox helps in archaeological study of an ancient rock drawing
S neox Five Axis: The S neox Five Axis S measures samples at different positions of rotation and elevation,thereby generating a group of individual measurements. The SensoFIVE software merges all of the surfaces, providing a sample surface with high accuracy by using the stacked image information of each single surface measurement. Merging different elevations, the system can provide shape and form information on sharp edges and/or critical surfaces.
Request a quote
Click here to request a quote on any Sensofar product.
This fall SwissLitho is releasing its newest product “NanoFrazor Explore DLS“. This unique hybrid nano-micro lithography system, which combines thermal Scanning Probe Lithography (tSPL) with Direct Laser Sublimation (DLS) was developed by Heidelberg Instruments and SwissLitho.
SwissLitho commercialized tSPL out of IBM Research in 2014 and its commercial NanoFrazor systems are installed at various institutions and used for the fabrication of nanodevices when usual nanolithography techniques get complicated or fail.
You are cordially invited to this workshop which aims to introduce the capabilities of the technologies of Heidelberg Instruments and SwissLitho and discuss their opportunities for McGill University researchers.
Date and time: 1:30 pm, Sept 17th, 2019
Place/Room: Rutherford Physics building, RM 105, 3600 University street
Program:
1:30 pm
NanoFrazor lithography – an overview
1:55 pm
NanoFrazor DLS – mix&match lithography in the same resist and same system
2:20 pm
Overview on various pattern transfer processes for NanoFrazor lithography
2:45-3:00 pm
Open user discussion
3:00-5:00 pm
Live System demo in CR
We are looking forward to seeing you at our workshop!
Optical tensiometer; Smart interfacial measurement solutions for wettability and adhesion
The new generation Theta Optical Tensiometer (Attension® Theta Flex) from Biolin Scientific is a contact angle meter that enables all measurements in one instrument for both research and quality control. It measures static and dynamic contact angle, 3D surface roughness, surface free energy, surface and interfacial tension, and interfacial rheology.
Theta Optical Tensiometer
One
instrument for all your measurement needs
All the measurements are readily included
in the software. Thanks to the modular design, all applications can be
fulfilled with one instrument and the instrument can be tailored for your
needs.
Results you can rely on
High-end imaging together with
sophisticated analysis algorithms detect and analyze the contact angle and
surface free energy precisely. The effect of roughness to wettability can be
measured with the unique 3D Topography module.
Speed and repeatability
All steps from loading the measurement to
performing it and analyzing the data can be automated. The need for time
consuming preparations and cleaning are removed with the disposable liquid
tips.
Attension Theta Flex can perform a
complete range of measurements including:
Static contact angle with the
sessile drop, captive bubble and meniscus methods
Dynamic contact angle with the
tilted drop and sessile drop methods
Surface free energy with the
sessile drop, captive bubble and meniscus methods
Surface- and interfacial
tension with the pendant drop and reverse pendant drop methods
Roughness-corrected contact angle and
3D surface roughness with the Fringe projection phase shifting method
Interfacial dilatational
rheology with the pulsating drop method
OneAttension software
OneAttension features an intuitive user
interface, live analysis and configurable user groups and accounts. In-depth
analysis of your results takes a few seconds and data can easily be exported.
Modules and accessories
Attension Theta Flex enables you to choose
the level of automation and the advanced functionalities that you need for your
applications. With the modular design and an extensive range of modules
and accessories you have room to upgrade or change the instrument as your
needs evolve.
Attension
Theta Flex: one instrument for all your measurement needs.
This exclusive quarterly newsletter highlights the latest product announcements, application specific solutions, and news about the company. Take a look inside the latest developments at Herzan and see if these new developments can complement your research!
Advances in Raman throughout the Pharmaceutical Manufacturing Process
The importance of quality control in continuous manufacturing has lead to a rapid increase in the use of Raman spectroscopy. In our latest webinar we explore how Raman spectroscopy is paving the way for innovation in advanced manufacturing techniques, with a presentation by Dr. Douglas Hausner of Associate Director of Rutgers University’s Engineering Research Center for Structured Organic Particulate Systems (C-SOPS).
New E-Book on the Tools, Techniques and Applications of Raman Spectroscopy
Portable and handheld Raman systems are gradually replacing slow and destructive techniques that have been widely used throughout the pharmaceutical industry. This month, B&W Tek partnered with American Pharmaceutical Review to release a new E-Book highlighting these recent developments in the industry. The E-book features various tools, techniques and applications that use Raman Spectroscopy to perform tasks such as at-line content uniformity, counterfeit detection and raw material identification.
Meet the Team!
Meet Kevin Wu: a seasoned foodie, full time cat dad and the new inside sales administrator at B&W Tek! Kevin is a Delaware native who graduated from Drexel University with a degree in criminal justice. He now uses his 7 years of experience in aviation quality control to give clerical assistance to our account managers and handle logistics for our sales team. It would be an understatement to say that we are excited to have Kevin join the B&W Tek family!
For the characterization of polymers and organic-coated surfaces, the combination of two surface sensitive techniques – X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) can be extremely powerful. XPS provides quantitative analysis and short-range bonding chemistry from elements on the outermost surface while TOF-SIMS can provide the molecular information needed to positively identify organic species and the spatial resolution needed to show their lateral distributions on the sample surface. This presentation will discuss the complementary attributes of XPS and TOF-SIMS and demonstrate how combining the two is essential to more fully understand organic surfaces.
We are looking forward to seeing you at our workshop!
