Learn all about New Sensofar System S wide exceptional 3D Optical Profiler which expands metrology towards a larger field of view for surface roughness measurement. The S wide integrates the benefits of a digital microscope into a hi-resolution, fast scanning measuring instrument.
- This new system improve routine operation through ease of use, with one-shot height measurements up to 40 mm, without Z-scanning
- Achievement of sub-micron height repeatability over entire extended area
- Color acquisition with the best resolution thanks to the integrated 5Mpx camera
- Form deviation from 3D CAD models for an effective integration to daily internal processes
Are you visiting us from America?
Wednesday, April 8th, 2020
6:00 PM to 7:00 PM CEST
Presented by: Daniel Sakakini