Broaden your Horizons with the New Sensofar System S wide

New Sensofar System S wide
Learn all about New Sensofar System S wide exceptional 3D Optical Profiler which expands metrology towards a larger field of view for surface roughness measurement. The S wide integrates the benefits of a digital microscope into a hi-resolution, fast scanning measuring instrument.

Key Topics:

  • This new system improve routine operation through ease of use, with one-shot height measurements up to 40 mm, without Z-scanning
  • Achievement of sub-micron height repeatability over entire extended area
  • Color acquisition with the best resolution thanks to the integrated 5Mpx camera
  • Form deviation from 3D CAD models for an effective integration to daily internal processes

Are you visiting us from America?

Wednesday, April 8th, 2020

6:00 PM to 7:00 PM  CEST

Presented by: Daniel Sakakini

Access our webinar from here

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