|Base Operating Software
|Microsoft Windows XP, 7
|C++(Microsoft Visual Studio 2005, 2008, 2010 Professional Edition)
|OTPL(Open Architecture Test System Test Programming Language)
|Re-configurable Program Structure
|Separated layers for test data and algorithm
|Scalable and Flexible Test
|Versatile Off-line Environment
|Thorough T2000 System Software Emulator
|Abundant Tester Tools
|Wave Tool (Logic Analyzer, Oscilloscope), Shmoo, Pattern Editor, etc.
EPP (Enhanced Performance Package)
EPP Enhanced Performance Package
The EP Package is a solution offering stronger and more diverse functionality, along with low test cost and shorter development time for testing programs of SoC devices, which Time to Volume is the key.
Three Expanded Functions
The new EP Package expands three functions to the current available T2000.
- Low-Cost Multi-Site CPU Configuration
Multi-site CPU configuration offers multi-site CPU functionality with cost in-line with that of traditional single-site CPUs, with high throughput and multi-user environment.
- Concurrent Test
Concurrent test enables simultaneous execution of multiple test flows, as well as faster development of shorter-time testing programs, through these it contributes to lower Cost of Test and shorter Time to Market.
- Functional Test Abstraction (FTA)
FTA makes execution of system-level design verification programs on ATE at the protocol level possible, shortening Time to Market.
Rich Functionality by High Density Mounting
The three expanded functions, together with new high-density modules, bring more diverse functionality while using fewer modules. This makes incorporating up to 8,192 digital channels possible, enabling over twice the parallel testing capacity of our earlier model.
The 1.6GDM is compatible with its predecessor module while offering increased throughput and reliability. It can communicate with the DUTs in each device’s protocol language and, through FTA-Elink, run Verilog code.
DPS90A incorporates 64 DPS channels, and supports parallel testing of SoC devices, for which power supplies are becoming ever more numerous.
GPWGD features wideband, high-sampling rate testing, and offers audio, video and baseband applications in a single module.
DPS150AE can handle the load requirements for highly accurate testing of both high-current and low-voltage semiconductors. The module improves the capabilities of the T2000 platform in performing high-throughput, multi-site testing of targeted devices with the lowest cost of test.
- EP Package
Multi-site CPU:max. 8 sites
Module support:max. 52
Supports concurrent test and functional test abstraction
(with TSC4+SGM208+CUTI configuration)
- 1GDM: 1Gbps Digital Module
Channels:256 per module
Max. data rate:1.1Gbps
- 1.6GDM: 1.6Gbps Digital Module
Channels:256 per module
Max. data rate:1.68Gbps
- DPS90A: Device Power Supply 90A
Power source: 2A x 32 channels, 0.8A x 32 channels Supports high-accuracy ISVM
- GPWGD: General Purpose Waveform Generator and Digitizer
Waveform Generators:8 (1Msps/50Msps)
Supports DC linearity test
- DPS150AE: Device Power Supply 150A
High Current function – 16A×8 channels
Low Current function – 2.66A×8 channels
Flexible and Scalable Test Platform
A truly open interoperable architecture scalable, re-configurable and flexible test architecture changes your approach to device testing.
Unlimited Module Choices
T2000 is best-in-class SoC device coverage with single platform. It provides value to customer to minimize engineering cost with single environment.
T2000 allows you to use best choice modules from a growing list of modules. An expanding menu of test modules provides you maximum flexibility and utilization of your systems and engineering resources.
Can a Single Platform Test All SoC Functions?
Most device testing requires a dedicated test system configuration. By changing modules, the T2000 enables you utmost flexibility to configure test solutions. The T2000 can match both current and future testing requirements.
The T2000 can be configured to test current DSP products, and with a module change can accommodate higher-speed buses and communication interfaces. One Scalable Platform.
Windows Based Operating System. Easy to Use. Easy to Customize.
The T2000 Operating System provides an easy-to-use environment and maximizes choices of application archives. Unified environment is minimizing engineering cost with single test programing methods and same look and feel for all device category development, production.
It enables a common software platform required for EDA and ATE companies to jointly adopt and support a variety of industry standards such as STIL and STDF test results.
Also you could use powerful GUI tools for development and debugging with navigation, auto tool linkage.
T2000 could provide you for value proposition with,
- Concurrent Debug environment to have x4 faster TTM
- Modular Test Program environment for integrated device test program development, debug.
- Fast coding, debugging by using EASE (Ease of Use) Package in Operating System.
- Best-in-Class Performance by using native Test Program language.
- Same coding style, look & feel and performance for all solutions.