Physical Electronics, Inc.

Physical Electronics (PHI) is a subsidiary of ULVAC-PHI, the world’s leading supplier of UHV surface analysis instrumentation used for the research and development of advanced materials in a number of high technology fields including nanotechnology, microelectronics, storage media, bio-medical, and basic materials such as metals, polymers, and coatings. PHI’s innovative XPS, AES, and SIMS technologies provide our customers with unique tools to solve challenging materials problems and accelerate the development of new materials and products.

 

Spectra Research Corporation and Physical Electronics, Inc.

 

Physical Electronics, Inc. collaborate with our customers to solve problems so they can develop better products and services. We develop instruments that help enable next-generation technologies.

Our Values:

  1. Customer Satisfaction: To partner with customers in determining and fulfilling expectations.
  2. Employee Fulfillment: A sense of accomplishment, recognition and personal growth aligned with work group and company culture.
  3. Innovation: Creating value from ideas that generate new products, new applications, new services and new processes.
  4. Integrity: A commitment to honoring our word and principles…and holding ourselves accountable.

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    • Intuitive Sample Navigation And Confident Analysis Area Identification
    • Superior Micro-Area Analysis
    • The Only Fully Automated High-Throughput Lab-Based Multitechnique XPS/HAXPES Instrument on the Market Commercially Available
    • Bring HAXPES synchrotron capabilities into your lab with the PHI Genesis
    • Optimized Depth Profiling
    • Suite Of Specialized Solutions For In Situ Characterization Of Advanced Materials

     

    • Automated high-throughput lab-based Hard/Soft X-ray Photoelectron Spectroscopy System
    • XPS/HAXPES microprobe with ≤ 7.5 µm spatial resolution for Al X-rays and < 14 µm for Cr X-rays
    • High sensitivity electrostatic detection optics
    • Dual beam charge neutralization
    • Robotic sample handling
    • Automated 5-axis stage
    • Two internal sample parking stations
    • Accepts samples up to 100 mm diameter and 25 mm thick
    • High performance floating column Ar ion gun
    • High speed snapshot depth profiling mode
    • Multipoint depth profiling within a single crater
    • Quantitative chemical state mapping
    • Automated angle dependent profiles

     

    • Scanned, micro-focused, monochromatic x-ray beam
    • X-ray beam induced secondary electron imaging
    • Dual beam charge neutralization
    • Large area XPS
    • Micro-area XPS
    • Chemical state imaging with 128 data channels
    • Sputter depth profiling
    • Floating column argon ion gun
    • Compucentric Zalar rotation
    • Angle dependent XPS
    • Five axis automated sample manipulator
    • 25 mm and 60 mm diameter sample holders

     

    • Cylindrical mirror analyzer (CMA)
    • Coaxial 25 kV field emission electron gun
    • Scintillation secondary electron detector
    • High energy resolution module
    • 5 axis automated sample stage
    • 5 kV floating column Ar+ ion gun
    • SmartSoft-Auger instrument control software
    • MultiPak data reduction software
    • Acoustic Enclosure
    • Ion pumped main chamber

     

    • TRIFT mass analyzer
    • 30 kV LMIG with Bi, Au, or Ga emitter
    • Dual beam charge neutralization
    • 5 axis sample stage
    • In-situ optical viewing
    • Secondary electron detector
    • WinCadence instrument control and data reduction software package
    • Analysis chamber with four primary ion gun ports
    • 350 l/s turbo molecular pump
    • Integrated bakeout facilities
    • MS/MS ready spectromoter

     

    • Scanned, micro-focused, monochromatic x-ray beam
    • X-ray beam induced secondary electron imaging
    • Dual beam charge neutralization
    • 128 channel mode detection
    • Large area XPS
    • Micro-area XPS
    • Chemical state imaging
    • Thin film analysis
    • Floating column argon ion gun
    • Compucentric Zalar rotation
    • Angle dependent XPS
    • Five axis automated sample manipulator
    • 75 X 75 mm sample holders
    • Two in-situ sample parking stations
    • Robotic sample handling

     


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