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XPS Instruments

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  • phi genesis Product Image
    phi genesis Product Image
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    PHI Genesis – Fully Automated Multi-Technique Scanning XPS/HAXPES Microprobe

     

    • Intuitive Sample Navigation And Confident Analysis Area Identification
    • Superior Micro-Area Analysis
    • The Only Fully Automated High-Throughput Lab-Based Multitechnique XPS/HAXPES Instrument on the Market Commercially Available
    • Bring HAXPES synchrotron capabilities into your lab with the PHI Genesis
    • Optimized Depth Profiling
    • Suite Of Specialized Solutions For In Situ Characterization Of Advanced Materials

     

  • PHI Quantes Scanning XPS
    PHI Quantes Scanning XPS
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    Physical Electronics, Inc. (PHI) PHI Quantes Scanning XPS/HAXPES Microprobe
    • Automated high-throughput lab-based Hard/Soft X-ray Photoelectron Spectroscopy System
    • XPS/HAXPES microprobe with ≤ 7.5 µm spatial resolution for Al X-rays and < 14 µm for Cr X-rays
    • High sensitivity electrostatic detection optics
    • Dual beam charge neutralization
    • Robotic sample handling
    • Automated 5-axis stage
    • Two internal sample parking stations
    • Accepts samples up to 100 mm diameter and 25 mm thick
    • High performance floating column Ar ion gun
    • High speed snapshot depth profiling mode
    • Multipoint depth profiling within a single crater
    • Quantitative chemical state mapping
    • Automated angle dependent profiles

     

  • PHI VersaProbe III Scanning XPS Microprobe
    PHI VersaProbe III Scanning XPS Microprobe
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    Physical Electronics, Inc. (PHI) PHI VersaProbe III Scanning XPS Microprobe
    • Scanned, micro-focused, monochromatic x-ray beam
    • X-ray beam induced secondary electron imaging
    • Dual beam charge neutralization
    • Large area XPS
    • Micro-area XPS
    • Chemical state imaging with 128 data channels
    • Sputter depth profiling
    • Floating column argon ion gun
    • Compucentric Zalar rotation
    • Angle dependent XPS
    • Five axis automated sample manipulator
    • 25 mm and 60 mm diameter sample holders

     

  • PHI Quantera II Scanning XPS Microprobe
    PHI Quantera II Scanning XPS Microprobe
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    Physical Electronics, Inc. (PHI) PHI Quantera II Scanning XPS Microprobe
    • Scanned, micro-focused, monochromatic x-ray beam
    • X-ray beam induced secondary electron imaging
    • Dual beam charge neutralization
    • 128 channel mode detection
    • Large area XPS
    • Micro-area XPS
    • Chemical state imaging
    • Thin film analysis
    • Floating column argon ion gun
    • Compucentric Zalar rotation
    • Angle dependent XPS
    • Five axis automated sample manipulator
    • 75 X 75 mm sample holders
    • Two in-situ sample parking stations
    • Robotic sample handling

     

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