Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM) for imaging the surface of a range of materials from metals to semiconductors to biological tissue, in some cases, to the atomic level. These instruments can also be used to characterize surface topography, surface chemistry and the nanomechanical properties of surfaces.
Below is a list of partners we work with in this field:
Atomic Force Microscopes
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- Compact and robust atomic force microscope for stand alone and large stage operation
- Easy and quick cantilever exchange and alignment reduces downtime
- Automated batch measurements and scripting interface for system integration
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All-in-one atomic force microscope for small samples and nanoeducation
- A robust and high-quality AFM product
- No setup needed: just plug in and go!
- Check out the NaioAFM video tutorials
- Options and accessories available
- Very competitive pricing: ask for a quote now!
About Spectra Research Corporation
Spectra Research Corporation (SRC) offers a range of innovative high-quality scientific products and laboratory services to industrial and scientific markets throughout Canada.
By selecting only the best products available and offering complete technical support, SRC is striving for continual improvement of our services and quality practices.
If you require exceptional laboratory services and support, our technical expertise and industry knowledge allows us to provide service and training for all the products we represent.