905-890-0555

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM) for imaging the surface of a range of materials from metals to semiconductors to biological tissue, in some cases, to the atomic level. These instruments can also be used to characterize surface topography, surface chemistry and the nanomechanical properties of surfaces.

Below is a list of partners we work with in this field:

Asylum
WITec
Herzan
NanoMagnetics Instruments

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Contact Spectra Research

Address

5805 Kennedy Rd
L4Z 2G3 Mississauga
Ontario
Canada

Phone :  905-890-0555

Toll Free : 1-866-753-4433
Fax :  905-890-1959

 

About Spectra Research

Spectra Research Corporation (SRC) offers a range of innovative high-quality scientific products and laboratory services to industrial and scientific markets throughout Canada.

Established in 1993, SRC is a subsidiary of Allan Crawford Associates (ACA), one of Canada’s largest distributors of electronic components, test equipment and integrated networking solutions.

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