RISE Microscopy - Correlative Raman Imaging and Scanning Electron Microscopy (Raman-SEM)

RISE Microscopy – Correlative Raman Imaging and Scanning Electron Microscopy (Raman-SEM)

RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging.

Quick and convenient switching between Raman and SEM measurement
Automated sample transfer from one measuring position to the other
Integrated software interface for user-friendly measurement control
Correlation of the measurement results and image overlay
No compromise in SEM and Raman imaging capabilities

Description

World’s first fully-integrated Raman Imaging and Scanning Electron Microscope

RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.

The RISE Microscope combines all features of a stand-alone SEM and the confocal Raman imaging microscope alpha300 within one instrument:

Quick and convenient switching between Raman and SEM measurement
Automated sample transfer from one measuring position to the other
Integrated software interface for user-friendly measurement control
Correlation of the measurement results and image overlay
No compromise in SEM and Raman imaging capabilities