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For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand. By advancing
key technologies and designs, Nanosurf has made the Flex-Axiom system one of the most versatile and flexible atomic force microscopes ever, allowing a large
variety of applications to be handled with ease. Together with the C3000 controller anything is possible.
Nanosurf offers different stages designed for specific experimental needs. Every stand-alone stage can be securely attached to the active vibration isolation table. The range begins with simple stages that can be optionally extended with an XY micrometer stage or height extensions to allow thicker samples.
For automated movement of the sample in X, Y, and Z, the ATS 204 is available. It is an automated translation stage that allows the user to control movement via the Nanosurf stage control unit and accompanying software. It can optionally be equipped with a high-resolution 100-µm Z-actuator with position sensor that is ideally suited for force spectroscopy measurements.
To facilitate electrochemical corrosion and deposition studies using the FlexAFM, we offer the ECS 204. It features an inert liquid cell embedded in a solid steel frame, a small protected compartment for oxygen-free atmosphere above the solution, and an integrated micrometer stage for lateral positioning (2 mm range).
The electrochemical cell can accommodate a true reference electrode, flat or rod-like samples and allows for liquid exchange.
With the additional standard sample platform it functions as a normal sample stage. The inverted microscope option provides a seamless integration with many types of inverted microscopes, allowing the combination of AFM and optical data (fluorescence/phase contrast/bright field).
Spectra Research Corporation (SRC) offers a range of innovative high-quality scientific products and laboratory services to industrial and scientific markets throughout Canada.
FlexAFM 5 scan head features
|General design||Tripod stand-alone scan head with tip scanner; Flexure-based electro-magnetically actuated XY-scanner with superbinearity; Piezo-based Z-actuator; Optical Z-position sensor; Closed loop Z-control|
|Laser / detector||High-speed, low-noise 4-quadrant photodiode detector; Choice between red laser and near-infrared SLD; Laser on/off through software and scan head tilting; Optical filters for use with optical microscope phase contrast and fluorescence|
|Approach||Approach with continuous DC-motor; Up/down arrows on scan head for manual approach; Software-driven automated final approach|
|Cantilever holder||Automatic self-alignment for cantilevers with alignment grooves. Manual laser adjustment possible for special cantilevers.|
|Sample observation||Top and side view in air and liquid; White LEDs (brightness 0–100%); Axial illumination for top view|
|Operating modes||Static Force, Lateral Force, Dynamic Force, Phase Contrast, MFM, EFM, KPFM, Piezo Force, Force Modulation,
Scanning Thermal, Spreading Resistance, Multiple Spectroscopy modes, Lithography and Manipulation modes. Some modes may require additional hardware and/or activating of the respective C3000 controller options.
|Scan head type||100-µm 10-µm|
||Unlimited w/o sample stage
100 mm on sample stage
|Maximum Petri dish height (fluid level)
||9 mm (6 mm)|
|Manual height adjustment range||6 mm|
|Motorized approach range (at tip position)||2 mm|
|Maximum scan range||100 µm (1) 10 µm (1)|
|Maximum Z-range||0 µm (2) 3 µm (1)|
|XY-linearity mean error||< 0.1%|
|XY-flatness at maximum scan range||typ. 5 nm typ. 1 nm|
|Detector bandwidth||DC – 4 MHz|
|Detector noise level||typ. 60 pm / max. 100 pm (3,4)|
|Z-sensor noise level (RMS) typ. 180 pm / max. 200 pm (3)|
|Z-measurement noise level (RMS, , static
mode in air)
|typ. 100 pm / max. 200 pm|
|Z-measurement noise level (RMS, dynamic
mode in air)
|typ. 35 pm / max. 50 pm|
|Scan head dimensions||143 × 158 × 53 mm|
|Scan head weight||1.25 kg|