Microgel thin film, surface potential image, 15 μm scan. Courtesy of C.D. Sorrell and L.A. Lyon, Georgia Institute of Technology.
DNA origami triangles, imaged in ᰀuid, ~120 nm per edge, 600 nm scan. Sample courtesy of P.W.K. Rothemund, California Institute of Technology.
Graphene on SiO2, AM-FM image of second mode frequency overlaid on topography, 2 µm scan. Sample courtesy of Fereshte Ghahari, Philip Kim, Columbia University and Dan Dahlberg, University of Minnesota.
Carbon nanotube attached to an electrode, EFM phase is overlaid on topography, 5 x 2.5 μm scan. Courtesy of Minot Lab, Oregon State University.
GaFeO3 thin film, PFM amplitude overlaid on topography, 1.25 µm scan. Sample courtesy of Somdutta Mukherjee, Rajeev Gupta and Ashish Garg, Department of Materials Science and Engineering, Indian Institute of Technology, Kanpur.
- Morphology and nanomechanics
- Organization in blends and copolymers
- Interface/interphase properties
- Investigation of thermal transitions
- Morphology and uniformity
- Hardness and wear properties
- Electrical conductivity
- Storage and loss moduli
Electronic Devices and other Advanced Materials
- Nanoscale failure analysis
- Data storage and magnetism
- Piezoelectric properties
- Batteries and photovoltaics
Bioscience and Biophysics
- Cell mechanics and mechanobiology
- Membranes and bilayers
- Biomolecular self-assembly
- Biomaterials and ecology