905-890-0555

Asylum Research MFP-3D Origin+ Atomic Force Microscope

 

 

 

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Description

 Asylum-Research-MFP-3DOrigin+  

 

 The best place to start with Atomic Force Microscopy

The MFP-3D Origin™ marks the intersection of performance and affordability in the Asylum Research MFP-3D™ AFM family. It features the technical excellence, innovation, and world-class customer support that is the trademark of every Asylum AFM that ships out our door. With full upgrade potential to the MFP-3D and its complete range of accessories, the MFP-3D Origin is simply the best place to start with atomic force microscopy. Asylum Research MFP-3D Origin Atomic Force Microscope

Why choose the MFP-3D Origin?

  • The most affordable member of the MFP-3D family
  • Leading closed-loop AFM resolution and performance
  • Modes and accessories that empower your research
  • Proven research productivity runs in the MFP-3D family
  • Unmatched customer support, every step of the way
  • Easily upgradable to the MFP-3D for maximum versatility

 

Microgel thin film, surface potential image, 15 μm scan. Courtesy of C.D. Sorrell and L.A. Lyon, Georgia Institute of Technology.

 

DNA origami triangles, imaged in ᰀuid, ~120 nm per edge, 600 nm scan. Sample courtesy of P.W.K. Rothemund, California Institute of Technology.

Graphene on SiO2, AM-FM image of second mode frequency overlaid on topography, 2 µm scan. Sample courtesy of Fereshte Ghahari, Philip Kim, Columbia University and Dan Dahlberg, University of Minnesota.

 

 

 

Carbon nanotube attached to an electrode, EFM phase is overlaid on topography, 5 x 2.5 μm scan. Courtesy of Minot Lab, Oregon State University.

 

GaFeO3 thin film, PFM amplitude overlaid on topography, 1.25 µm scan. Sample courtesy of Somdutta Mukherjee, Rajeev Gupta and Ashish Garg, Department of Materials Science and Engineering, Indian Institute of Technology, Kanpur.

 

 

 

Polymers

  • Morphology and nanomechanics
  • Organization in blends and copolymers
  • Interface/interphase properties
  • Investigation of thermal transitions

 Thin Films

  • Morphology and uniformity
  • Hardness and wear properties
  • Electrical conductivity
  • Storage and loss moduli

Electronic Devices and other Advanced Materials

  • Nanoscale failure analysis
  • Data storage and magnetism
  • Piezoelectric properties
  • Batteries and photovoltaics

 

 Bioscience and Biophysics

  • Cell mechanics and mechanobiology
  • Membranes and bilayers
  • Biomolecular self-assembly
  • Biomaterials and ecology

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Asylum Research MFP-3D Origin Atomic Force Microscope

Contact Spectra Research

Address

3585 Laird Rd., Unit 15 & 16,
L5L 5Z8 Mississauga
Ontario
Canada

Phone :  905-890-0555

Toll Free : 1-866-753-4433
Fax :  905-890-1959

About Spectra Research

Spectra Research Corporation (SRC) offers a range of innovative high-quality scientific products and laboratory services to industrial and scientific markets throughout Canada.

Established in 1993, SRC is a subsidiary of Allan Crawford Associates (ACA), one of Canada’s largest distributors of electronic components, test equipment and integrated networking solutions.

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