905-890-0555

Ambivalue EyeTech™ Combi

Particle size & shape analysis using laser obscuration and video

  • Fast and accurate Particle Size Analysis with the unique Laser Obscuration Time technique.
  • Accurate description of non-spherical materials with sophisticated Dynamic Image Analysis using the video channel.
  • Results are independent of physical or optical properties of the particles or medium

 

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Introducing the Ambivalue EyeTech™ Combi

The EyeTech™ combines two Single Particle Sizing methodologies: a Dynamic Laser Technology and a Dynamic Video/Camera technology both on the same sample. Single Particle Sizing ensures high resolution and better results. Measurement of the samples is much closer to the nature of the sample compared with Assembling Technologies like Laser diffraction.

The EyeTech™ brings size, shape and concentration data together to form a comprehensive blue print of your particle system. The remarkable flexibility of the EyeTech™ gives answers to all your particle questions!

 

Ambivalue EyeTech™ Combi



Ambivalue EyeTech™ Combi

Key Features

The Ultimate Particle Analyzer!

The EyeTech brings size, shape, and concentration data together to form a comprehensive blue print of your particle system. The remarkable flexibility of the EyeTech enables you to:

  • Monitor kinetic processes
  • Plot multi-dimensional data by jotting size
  • against shape
  • Analyze complex data to reveal secondary
  • distributions within the distribution
  • Identify individual particles in the
  • distribution, by recalling a picture from the
  • database
  • Generate standard volume and number
  • distribution results

Shape and size related data by dynamic image analysis provide a wealth of data on each individual particle, this information can be displayed in scattergrams to examine a samples particle size versus partide shape trends. The shape filter also has the functionality of an optical filter, allowing the user to zoom in on specific fractions within the sample according to size or shape characteristics.

Ambivalue EyeTech Combi


Key Benefits

This all with the friendly, 21 CFR Part 11 compliant software with more than 40 shape-parameters and the data output for size-distributions in the format you wish.

 

The EyeTech measurement is simultaneously accurate for both opaque and transparent particles in the sample. Opaque particles obscure the laser beam completely, so the obscuration time is
easily determined. As translucent or semi-transparent particles are partially diffuse to the laser beam, they will pass on some light to the detector resulting in partial obscurations. However, at the
particle boundaries, the detector observes complete obscuration on the edges. The partial transmission of the laser through the center will cause a decreasing signal and a deeper belly towards
the baseline of the pulse. Since the pulse intensity is not used for the particle size measurement and the obscuration time between the particle’ s boundaries can be easily determined, correctly analyzing transparent particles is assured. Therefore, samples with opaque, transparent or mixtures of particles are measured accurately in a single measurement, independent of transparency.


Ambivalue EyeTech™ Combi


Trust the Experts at Spectra Research Corporation

Spectra Research Corporation (SRC) offers a range of innovative high-quality scientific products and laboratory services to industrial and scientific markets throughout Canada.

Specifications

 

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Contact Spectra Research

Address

3585 Laird Rd., Unit 15 & 16,
L5L 5Z8 Mississauga
Ontario
Canada

Phone :  905-890-0555

Toll Free : 1-866-753-4433
Fax :  905-890-1959

About Spectra Research

Spectra Research Corporation (SRC) offers a range of innovative high-quality scientific products and laboratory services to industrial and scientific markets throughout Canada.

Established in 1993, SRC is a subsidiary of Allan Crawford Associates (ACA), one of Canada’s largest distributors of electronic components, test equipment and integrated networking solutions.

Spectra Research Location

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