905-890-0555

alpha300 A – Nanoscale Surface Characterization

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Description

The WITec Atomic Force Microscope alpha300 A is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope and provides superior optical access, easy cantilever alignment and high-resolution sample survey.

WITec Atomic Force Microscopes are developed and designed to allow combination with other imaging techniques such as confocal Raman imaging. All imaging techniques can be integrated within the same microscope system. By simply rotating the microscope turret the user can then switch between the different methods. Possible combinations with AFM include luminescence, fluorescence, polarization analysis, bright field, dark field, SNOM, and Raman imaging.

Key Features

  • Surface characterization on the nanometer scale
  • Lateral resolution: down to 1 nm
  • Depth resolution: < 0.3 nm
  • Wide range of AFM modes included
  • User-friendly sample access from any direction
  • Ease-of-use in air and liquids
  • Unique cantilever technique for convenient cantilever exchange and alignment
  • Precise TrueScan™ controlled scan stages with a selectable scan range of 30 x 30 x 20 µm³; 100 x 100 x 20 µm³; or 200 x 200 x 20 µm³
  • Non-destructive imaging technique with minimal, if any, sample preparation
  • Upgradeable with confocal Raman imaging and Nearfield-Microscopy (SNOM) in one microscope

Contact Spectra Research

Address

3585 Laird Rd., Unit 15 & 16,
L5L 5Z8 Mississauga
Ontario
Canada

Phone :  905-890-0555

Toll Free : 1-866-753-4433
Fax :  905-890-1959

About Spectra Research

Spectra Research Corporation (SRC) offers a range of innovative high-quality scientific products and laboratory services to industrial and scientific markets throughout Canada.

Established in 1993, SRC is a subsidiary of Allan Crawford Associates (ACA), one of Canada’s largest distributors of electronic components, test equipment and integrated networking solutions.

Spectra Research Location

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