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Governmental Research

Showing 17–32 of 41 results


    • Mounts on virtually every upright optical microscope or 3D optical profilometer
    • Integrated motor for automated cantilever approach and engage
    • Standard and extended AFM modes available through a modular controller

     

    • Compact and robust atomic force microscope for stand alone and large stage operation
    • Easy and quick cantilever exchange and alignment reduces downtime
    • Automated batch measurements and scripting interface for system integration

     

    • Atomic resolution in minutes
    • Extremely simple handling and reliable operation
    • Controller and scan head integrated into a single device: just connect USB and power
    • Starting at less than $10,000 USD

     

    • Minimum substrate size: 3 mm x 3 mm
    • Maximum exposure area: 6” x 6” (optional 8”x 8”)
    • Minimum structure size down to 0.6 μm
    • Maximum write speed: 1400 mm2/min at 1 μm feature size
    • Real-time autofocus
    • Overview camera for fast alignment and inspection
    • Front- and backside alignment
    • Temperature-controlled environmental chamber
    • Exposure wavelengths: 405 nm and / or 375 nm
    • Draw Mode for CAD-less exposure
    • Standard Grayscale Exposure Mode
    • High-Aspect Ratio Mode
    • Easy-to-use operating software

     

    • Confocal Raman Imaging with unprecedented performance in speed, sensitivity, and resolution
    • Hyperspectral image generation with the information of a complete Raman spectrum at every image pixel
    • Excellent lateral resolution
    • Outstanding depth resolution ideally suited for 3D image generation and depth profiles
    • Ultra-fast Raman imaging option with under one millisecond integration time per spectrum
    • Ultra-high throughput spectroscopic system for highest sensitivity and best performance in spectral resolution
    • Non-destructive imaging technique: no staining of fixation of the sample required

     

    • Research grade optical microscope with 6 x objective turret
    • Video system: color video camera
    • LED white-light source for Köhler illumination of tip and sample
    • Manual sample or motorized positioning in x- and y-direction
    • Microscope base with active vibration isolation system
    • Various piezo-driven scan stages, fully capacitive feedback-controlled

     

    • Spatial resolution beyond the diffraction limit (ca. 60 nm laterally)
    • Unique patented SNOM sensor technique
    • Ease-of-use in air and liquids
    • Various Atomic Force Microscopy modes included
    • Non-destructive imaging technique with minimal, if any, sample preparation
    • Upgradeable with confocal Raman imaging in one microscope

     

     

  • For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with Scanning Near-field Optical Microscopy for optical imaging with resolution beyond the diffraction limit.

    • simplifies operation of the instrument.
    • requires less human input.
    • reduces potential sources of error.
    • enhances reproducibility.
    • allows for completely remote-controlled use in enclosed environments (i.e. in a glove box).

     

     

    • access to high-performance Raman spectroscopy and spectral Raman mapping
    • access to high-quality and ultra-precise optical microscopy components
    • access to exceptional spectral quality provided by the WITec UHTS spectrometer series
    • access to class-leading capability within challenging budget environments
    • access to the WITec Raman and imaging know-how
    • access to the future of Raman spectroscopy through upgradeability

     

    • An inverted beam path allows liquid samples to be placed on the fixed plane of the stage for quick and repeatable measurements.
    • The motorized sample stage also facilitates the mounting of environmental enclosures and other accessories.
    • Bulky samples that would be challenging to investigate underneath a conventional microscope objective turret can be accommodated by placing them on the stage of the alpha300 Ri.
    • Compatible with other microscopy techniques including: fluorescence, differential interference contrast (DIC) and phase-contrast
    • Features all the unique and established imaging and spectroscopy capabilities of the WITec alpha300 R series.
    • Non-destructive imaging technique: no staining of fixation of the sample required

     

  • Contact angle meter for all your measurement needs. Theta Flex is designed to fit both research and quality control.

    • Static contact angle
      Sessile drop, captive bubble and meniscus methods
    • Dynamic contact angle
      Dynamic contact angle, advancing and receding contact angle, contact angle hysteresis and roll-off angle
    • Surface free energy
      Sessile drop, captive bubble and meniscus methods
    • Surface- and interfacial tension
      Pendant drop and reverse pendant drop methods
    • Roughness-corrected contact angle and 3D surface roughness
      Fringe projection phase shifting method
    • Interfacial dilatational rheology
      Pulsating drop method

     

  • Features & Benefits

    • Integrated method enabling to define contact angle and surface roughness accurately from the same location and to combine both surface chemical and topographical data with automated software calculations.
    • Offers fast surface characterization method, which does not demand specialist to run the samples.
    • Versatile roughness measurement: both 2D and 3D characterization..

     

    Theta Topography Module

    Theta Range Brochure

     

  • Optical tensiometer especially suitable for interfacial rheology with the pulsating drop method.

    • Interfacial dilatational rheology 
      Pulsating drop method
    • Surface- and interfacial tension
      Pendant drop and reverse pendant drop methods
    • Static contact angle
      Sessile drop, captive bubble, and meniscus methods
    • Surface free energy
      Sessile drop, captive bubble, and meniscus methods
    • Dynamic contact angle
      Dynamic contact angle, advancing and receding contact angle, contact angle hysteresis, and roll-off angle
    • Roughness-corrected contact angle and 3D surface roughness
      Fringe projection phase shifting method

     

  • Contact angle meter that measures the wettability on small areas effectively.

    • Static contact angle even on areas smaller than 100 µm
      Sessile drop
    • Surface free energy
      Sessile drop, captive bubble and meniscus methods 
    • Roughness-corrected contact angle and 3D surface roughness 
      Fringe projection phase shifting method 
    • Dynamic contact angle
      Dynamic contact angle, advancing and receding contact angle, contact angle hysteresis and roll-off angle 
    • Surface- and interfacial tension
      Pendant drop and reverse pendant drop methods 
    • Interfacial dilatational rheology
      Pulsating drop method

     


Showing 17–32 of 41 results

Contact Spectra Research

Address

3585 Laird Rd., Unit 15 & 16,
L5L 5Z8 Mississauga
Ontario
Canada

Phone :  905-890-0555

Toll Free : 1-866-753-4433
Fax :  905-890-1959

Email: info@spectraresearch.com

About Spectra Research

Spectra Research Corporation (SRC) offers a range of innovative high-quality scientific products and laboratory services to industrial and scientific markets throughout Canada.

Established in 1993, SRC is a subsidiary of Allan Crawford Associates (ACA), one of Canada’s largest distributors of electronic components, test equipment and integrated networking solutions.

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