Governmental Research

• Frequency stabilized laser and artefact-free Avalanche Photodiode (APD) detector
  → High measurement accuracy
  → Very low sample scattering
• Embedded dedicated PC, including software correlation and complete and dedicated software NanoKin®
  → User-friendly interface
  → Photon-counts storage for time-resolved analysis and post-analysis
  → Full reports, including kinetic analysis
• Enhanced mathematical models
  → Better reliability of results
  → 2D colormap of size distribution over time

• Form deviation from 3D CAD models
• Calibration of surface texture measuring instruments
• Sub-micron height repeatability over entire extended area
• One shot height measurement up to 40 mm without Z scanning
• Bi-telecentric lenses with very low field distortion providing accurate metrology

• Flexible. Powerful.
• 3D auto function
• Live image options
• Designed to be
• simple and easy to use
• It is time to play. . .
• uses premium CF60-2 Nikon objectives
• Obtain a clear and well-structured report
• Adaptable column – Flexible options are designed to avoid restrictions between samples with differing heights.

• Complete accessibility
• Cover a wide range of scales
• Maximum versatility
• A complete 3D measurement
• Measure angles greater than 90º
• Measurements without limitation
• Accurate and reliable

The DriveAFM, Nanosurf‘s new flagship instrument, utilizes the latest technology to deliver stable, high-end performance. It was designed to fulfill the needs of top notch research, today and in the future.

• CleanDrive: stable excitation in air and liquid
• Ultra low noise: below 15 fm/√Hz
• Direct drive: high-resolution imaging and large scan area
• Fully motorized system: full control via software

• simplifies operation of the instrument.
• requires less human input.
• reduces potential sources of error.
• enhances reproducibility.
• allows for completely remote-controlled use in enclosed environments (i.e. in a glove box).

• Confocal Raman Imaging with unprecedented performance in speed, sensitivity, and resolution
• Hyperspectral image generation with the information of a complete Raman spectrum at every image pixel
• Excellent lateral resolution
• Outstanding depth resolution ideally suited for 3D image generation and depth profiles
• Ultra-fast Raman imaging option with under one millisecond integration time per spectrum
• Ultra-high throughput spectroscopic system for highest sensitivity and best performance in spectral resolution
• Non-destructive imaging technique: no staining of fixation of the sample required

For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with Scanning Near-field Optical Microscopy for optical imaging with resolution beyond the diffraction limit.

• An inverted beam path allows liquid samples to be placed on the fixed plane of the stage for quick and repeatable measurements.
• The motorized sample stage also facilitates the mounting of environmental enclosures and other accessories.
• Bulky samples that would be challenging to investigate underneath a conventional microscope objective turret can be accommodated by placing them on the stage of the alpha300 Ri.
• Compatible with other microscopy techniques including: fluorescence, differential interference contrast (DIC) and phase-contrast
• Features all the unique and established imaging and spectroscopy capabilities of the WITec alpha300 R series.
• Non-destructive imaging technique: no staining of fixation of the sample required

• access to high-performance Raman spectroscopy and spectral Raman mapping
• access to high-quality and ultra-precise optical microscopy components
• access to exceptional spectral quality provided by the WITec UHTS spectrometer series
• access to class-leading capability within challenging budget environments
• access to the WITec Raman and imaging know-how
• access to the future of Raman spectroscopy through upgradeability

• Spatial resolution beyond the diffraction limit (ca. 60 nm laterally)
• Unique patented SNOM sensor technique
• Ease-of-use in air and liquids
• Various Atomic Force Microscopy modes included
• Non-destructive imaging technique with minimal, if any, sample preparation
• Upgradeable with confocal Raman imaging in one microscope

• Research grade optical microscope with 6 x objective turret
• Video system: color video camera
• LED white-light source for Köhler illumination of tip and sample
• Manual sample or motorized positioning in x- and y-direction
• Microscope base with active vibration isolation system
• Various piezo-driven scan stages, fully capacitive feedback-controlled

• ens-based imaging spectrometers
• Specifically designed for low light intensities
• Excellent throughput
• Symmetric peak shape (coma/astigmatism free)
• Automatic triple-grating turret
• FC/APC optical fiber port
• Can be fitted with FI- and BI-CCD cameras
• Controlled via WITec software

Features & Benefits

• Integrated method enabling to define contact angle and surface roughness accurately from the same location and to combine both surface chemical and topographical data with automated software calculations.
• Offers fast surface characterization method, which does not demand specialist to run the samples.
• Versatile roughness measurement: both 2D and 3D characterization..

Theta Topography Module

Theta Range Brochure

• Scanned, micro-focused, monochromatic x-ray beam
• X-ray beam induced secondary electron imaging
• Dual beam charge neutralization
• Large area XPS
• Micro-area XPS
• Chemical state imaging with 128 data channels
• Sputter depth profiling
• Floating column argon ion gun
• Compucentric Zalar rotation
• Angle dependent XPS
• Five axis automated sample manipulator
• 25 mm and 60 mm diameter sample holders