Flexibility can be the key to addressing a wide range of microscopy applications in many different fields of research. Structural, chemical and mechanical characteristics of materials can all be imaged and analyzed with an instrument that combines Confocal Raman Microscopy and Atomic Force Microscopy (AFM). With an integrated platform, chemical information from Raman analysis can be directly linked to structural and mechanical data derived from AFM imaging, simultaneously, on the same spot on the sample.
Our partners at WITec offer a full line of near-field optical microscopy (NSOM), Confocal Raman Imaging and AFM instruments for materials research and nanotechnology. Their modular design allows for an integrated imaging platform that combines these techniques; providing high-resolution chemical and structural analysis on the same sample area at the same time using only one instrument.
Recently, WITec introduced the StrobeLock add-on that can be integrated with their entire Raman, AFM and SNOM lines of microscopes. This add-on provides another dimension to the WITec platform; fluorescence lifetime imaging.
“This exceptional development significantly extends the capabilities for the WITec microscope series and opens a new field of application for a more comprehensive sample characterization,” said Dr. Joachim Koenen, WITec co-founder and Managing Director, in a news release.
StrobeLock is a pulsed excitation laser system combined with a Time-Correlated Single-Photon Counting (TCSPC) detector.
Being able to switch between time-resolved and conventional mode means a microscope user can conveniently choose their preferred measurement technique. And that makes these instruments much more flexible.
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