905-890-0555

nanoIR2™ – IR Spectroscopy Platform

nanoIR2TM with top side illumination | AFM+ IR Spectroscopy | AFM+ Thermal Analysis

  • Expands nanoscale IR to a broad range of real world samples
  • New resonance enhanced mode enables nanoscale IR on <20nm films
  • Rich, interpretable IR spectra
  • Powerful, full featured AFM
  • Multifunctional measurements including integrated thermal and mechanical property mapping
  • Designed and built for productivity and rapid time-to-results

 

 

 

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Description

Introducing nanoIR2™, the nanoscale IR spectroscopy platform. The breakthrough nanoIR2 system features top-side illumination which greatly expands the range of samples that can be studied. It combines the nanoscale spatial resolution capabilities of atomic force microscopy (AFM) with infrared spectroscopy’s ability to characterize and identify chemical species. It is an easy to use and powerful multifunctional platform with a full-featured AFM and nanoscale thermal & mechanical analysis. nanoIR
Anasys is a manufacturer of afm-atomic force microscopes, thermal scanning microcopy instruments and nanoscale IR-infrared equipment. We provide thermal analysis and surface finish-roughness nano metrology measurement. We also manufacture afm heat tips and probes

Chemical Analysis of Semiconductor Devices nanoIR

nanoIR2 measurements on layers in a semiconductor device. The analysis reveals variations in chemical composition not measurable by conventional IR microscopy.

nanoIR2 measurements on layers in a semiconductor device. The analysis reveals variations in chemical composition not measurable by conventional IR microscopy.

Interface Analysis of Composites

nanoIR2 measurements on a carbon fiber-epoxy composite revealing variations in chemical composition across the fiber/epoxy interface. This measurement was performed on a polished bulk sample.

nanoIR2 measurements on a carbon fiber-epoxy composite revealing variations in chemical composition across the fiber/epoxy interface. This measurement was performed on a polished bulk sample.

 

Organic Nanocontaminant on Metal Surface

Organic Nanocontaminant

Spectra collected using the resonant enhanced mode allows identification of nanoscale organic contamination on a magnetic disk. This particle has dimensions of approximately 100 nm x 200 nm x 28 nm.

Microtomed Toner Particle

Microtomed Toner Particle

Toner particles are a complex mixture of multiple components, the nanoIR2 allows identification and localization of these components with nanoscale resolution.

RELATED PRODUCTS

afm+_product_1

AFM +® Atomic Force Microscopes nanoIR

Full featured AFM

  • All common imaging modes
  • High resolution closed loop imaging with excellent noise performance

Easy to setup and operation

  • The afm+ is built for maximum ease of use; premounted cantilevers allow fast and easy alignment
  • Motorized sample stage and high quality optics allow rapid location of the analysis area
  • Decades of AFM expertise distilled into instrument design means faster time to results, even for novice users

Powerful localized nanoscale analytical techniques pioneered by Anasys world leading scientific team

  • Thermal: nanoscale thermal analysis with our patented ThermaLever probes
  • Mechanical: wideband nanomechanical analysis with our Lorentz Contact Resonance mode
  • Chemistry: upgradeable to add nanoscale IR Spectroscopy for localized chemical composition
nanoIR2-transparent-bg_1

nanoIR2™ – IR Spectroscopy Platform

nanoIR2TM with top side illumination | AFM+ IR Spectroscopy | AFM+ Thermal Analysis

  • Expands nanoscale IR to a broad range of real world samples
  • New resonance enhanced mode enables nanoscale IR on <20nm films
  • Rich, interpretable IR spectra
  • Powerful, full featured AFM
  • Multifunctional measurements including integrated thermal and mechanical property mapping
  • Designed and built for productivity and rapid time-to-results

 

 

 

 

Contact Spectra Research

Address

5805 Kennedy Rd
L4Z 2G3 Mississauga
Ontario
Canada

Phone :  905-890-0555

Toll Free : 1-866-753-4433
Fax :  905-890-1959

 

About Spectra Research

Spectra Research Corporation (SRC) offers a range of innovative high-quality scientific products and laboratory services to industrial and scientific markets throughout Canada.

Established in 1993, SRC is a subsidiary of Allan Crawford Associates (ACA), one of Canada’s largest distributors of electronic components, test equipment and integrated networking solutions.

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