Anasys Instruments introduces the second generation of its award winning nano thermal analysis product, the nano-TA2. This system extends the capabilities of the nano-TA system by the addition of local temperature mapping via the Scanning Thermal Microscopy (SThM) mode at a resolution of 0.1º C. This is achieved by a significant improvement in the noise levels as well as higher resolution electronics. The system also incorporates significantly more control due to the addition of a Digital signal processor (DSP), field programmable gate array (FPGA) and on board memory. This allows it to obtain heating rates up to 600,000º C/min (100x higher than before) as well as improved control of the heating rate in slower temperature ramps. Nano TA
The nano-TA2 is an accessory (comprising hardware, software and probes) that enables a number of commercially available AFMs to perform nano Thermal Analysis (nanoTA), Heated Tip AFM (HT-AFM) and SThM.
In the nano TA mode, the user visualizes the sample at a typical resolution of better than 30 nm, identifies the regions of interest and then positions the probe using the AFM to subject the region in contact with the probe to a thermal ramp. Shown to the left is a schematic of the nano Thermal Analysis mode showing the initial upwards deflection of the cantilever due to thermal expansion followed by the penetration of the probe due to softening or melting. This will typically happen at the glass transition or melt transition of the sample. The heating of the probe is due to a high resistance region incorporated into a silicon probe that is otherwise much like a standard silicon probe. This allows rapid, controllable heating up to by controlling the voltage applied to the probe using the nano-TA2 electronics. During the ramp, the operator can monitor, using the included software, up to four of a range of signals available including the The nano-TA2 electronics comprising the power supply, TMA controller and CAL box. nano-TA schematic Anasys Instruments Corp., 121 Gray Ave, Suite 100, Santa Barbara, CA 93101 www.anasysinstruments.com deflection of the cantilever, the resistance of the thermal probe or the power applied to the thermal probe. In addition, the power or resistance of the cantilever can be ramped to achieve a more controlled heating of the probe on rough or heterogeneous samples. The local heating means the system is ideally suited to make measurements of thin films, polymer blends and nanocomposites in the polymer market. In the pharmaceutical market, the system can be used to study spatial mapping of crystallinity, identification of amorphous / crystalline regions in a semi-crystalline sample, mapping of polymorphs, identification of components in compressed tablets and analysis of tablet coatings.
This is the second generation from our nanoscale thermal analysis (nano-TA) family and it adds a powerful DSP controller to this technique which enables sub-100nm local thermal analysis for most commercially available AFMs. This resolution is 100x better than previously reported and is made possible by our thermal probe technology which enables you to:
- Image the sample of interest with sub-30nm spatial resolution (in contact or intermittent contact modes) and identify the regions whose thermal properties that you’d like to study.
- Heat a local area of less than 100nm diameter with the probe to temperatures of over 400˚C to study thermal properties such as glass transition or melting point.
- Local heating allows very fast heating rates up to 600,000˚ C/min and eliminates thermal drift issues that plague bulk sample heating approaches.
- Image with a heated tip to induce local thermal events over specific regions of a surface.
- Map the temperatures across the sample with a resolution of <0.1 ºC