Hysitron® fall under the product categories of Materials Characterization and NanoMechanical Testing. They are the world leader in developing nanomechanical test instruments and has designed cutting edge technology for the scientific community since 1992. As the pioneers of in situ imaging with nanomechanical property measurement capabilities, Hysitron has developed innovative technology for characterizing surfaces on the nano-scale.

In addition to nano indentation and microindentation, Hysitron’s nanoindenter instrument capabilities include tribology, modulus mapping, dynamic mechanical analysis, nano-scratch testing, acoustic emission monitoring, electrical contact resistance and in situ SEM and TEM nanomechanical testing.

Standard Hysitron instruments offer normal forces up to approximately 10 mN and is capable of lateral force testing. The company provides a number of options on most platforms that can increase the normal force up to about 10N.

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  • The World’s Most Powerful Nanomechanical & Nanotribological Test System for All Your Material Analysis Needs

    The TI 980 TriboIndenter is Hysitron’s latest, most advanced nanomechanical test instrument that lies at he intersection of maximum performance, flexibility, reliability, usability, and speed. The TI 980 anoindenter is the next-generation of Hysitron’s renowned TriboIndenter product family, building upon ecades of technological innovation to deliver a new level of extraordinary performance, enhanced apabilities, and ultimate versatility in nanomechanical and nanotribological characterization.

    • Easy-to-use interface for beginners, with the ability to perform advanced customization
    • Data explorer functionality provides simplified data management and streamlined time to results
    • Analyze and plot all data present in a folder, automatically
    • Automated and customizable report generation
    • Integrated approach to the calibration→testing→analysis→report process


    • anometer resolution in-situ Scanning Probe Microscopy imaging enables quantitative characterization of pretest surface morphology and post-test deformation behavior
    • High-precision test placement accuracy of ±10nm maximizes data accuracy, reliability, and repeatability when testing at the nanoscale
    • Top-down, probe scanning system architecture allows imaging of samples with broad range of geometries and masses
    • A 70nN imaging contact force provides reliable imaging of soft materials and delicate surface structures
    • Fully customizable SPM resolution options from 64 x 64 (fast scan) to 4096 x 4096 (high resolution)
    • Customizable X-Y scan dimensions and resolutions allow imaging of high aspect ratio features with maximum pixel densities, up to 16384 x 512


    • Ultra-high speed quantitative mechanical property measurements (6 per second)
    • Rapid, high-resolution mapping of hardness and modulus with distribution statistics
    • Acquire large quantities of statistically significant data in a short period of time
    • 500x faster than traditional nanoindentation testing
    • Obtain a robust tip area function calibration within a minute
    • Compatible with Hysitron’s xSol® environmental control stage for rapid testing throughput under extreme environmental conditions


    • Integration of Hysitron’s full suite of testing techniques into a single, intuitive software package
    • Tab-based architecture simplifies software navigation and helps users follow the instrument operational sequence
    • Flexible, segment-by-segment test definition graphical user interface streamlines the test setup in all modes of operation
    • XPM ultra-fast nanoindentation for rapid property mapping and rapid acquisition of statistically significant data sets
    • SPM+ high resolution in-situ imaging with customizable scan resolution and dimensions
    • Multi-scale sample imaging with whole sample optical surveying, macro-to-nanoscale zoom capabilities, and data overlays


  • Reaching Beyond Nano- Tribomechanical Testing

    • Direct and quantitative measurements with AFM level noise floors
    • MEMS based transducer for enhanced force and displacement sensitivity
    • Lateral force imaging for friction mapping
    • High resolution in-situ SPM imaging
    • Ultra-low force and displacement testing for extremely thin materials and sensitive materials


  • MEMS Technology For Quantitative Nanomechanical Measurement at Scales Previously Unimaginable

    • Quantitative measurement of mechanical properties on films as thin as a few nanometers
    • In-situ SPM imaging with nanonewton range contact forces minimizes disturbance to the surface during imaging, enabling surface imaging of compliant samples while resolving angstrom scale features
    • Rapid mechanical and electronic response provides exceptional feedback control and allows high strain rate nano indentation testing, spanning several orders of magnitude
    • Available in a 2D design for high-sensitivity tribological testing and frictional force microscopy
    • Patented two-dimensional capacitive transducer technology provides highly sensitive nanoindentation and nanoscratch testing capabilities
    • Quantitative measurement of friction over the nanoscale to microscale
    • Enables rapid interfacial adhesion characterization of thin films and coatings


  • Industry-Leading Control for Quantitative Nanomechanical and Nanotribological Characterization

    • State-of-the-art Digital Signal Processor (DSP) plus Field Programmable Gate Array (FPGA) controller architecture
    • Fully integrated multi-technique control for seamless operation of multiple Hysitron transducers, piezo scanners, dynamic signal generators (nanoDMA® III), and electrical sourcing and measurement (nanoECR®) with maximum signal synchronicity
    • Industry-leading force and displacement noise floors enable characterization to the bottom of the nanoscale:
      • Standard Capacitive Transducer Noise Floors: 0.1nm displacement and 20nN force
      • xProbe™ Transducer Noise Floors: 0.01nm displacement and 1nN force
    • Ultra-fast feedback control loops and data acquisition rates reliably track rapid transient events and deliver high speed testing capabilities
    • Modular controller architecture with up to 24 channels of auxiliary data acquisition and external device control
    • Simultaneous 1.2MHz data sampling rate and 78kHz feedback loop rate on all channels
    • High speed control and acquisition enables 500x faster testing than traditional nanoindentation testing routines, up to 6 measurements per second


  • The World’s Most Comprehensive and Quantitative Nanomechanical Test Instrument

    The Hysitron TI 950 TriboIndenter® is the next-generation nanomechanical test instrument providing industry-leading sensitivity and unprecedented performance. The TI 950 nanoindenter has been developed as an automated, high throughput instrument to support the numerous nanomechanical and nanotribological characterization techniques developed by Hysitron. The TI 950 nanoindenter system incorporates the powerful performech® Advanced Control Module, which greatly improves the precision of feedback-controlled nanomechanical testing, provides dual head testing capability for nano/micro scale connectivity, and offers unprecedented noise floor performance. The numerous nanomechanical testing techniques offered by Hysitron, as well as new testing methods currently being developed, make the TI 950 TriboIndenter an extremely versatile and effective nanomechanical characterization tool for the broadest range of applications.

Showing all 11 results